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Specifications
Impedance @ Frequency:
180Ω@100MHz
Voltage Rating - DC:
50V
Number of Lines:
2
DC Resistance(DCR):
350mΩ
Operating Temperature:
-40℃~+125℃
Current Rating:
330mA
Mfr. Part #:
WQCF2012Z0M181PB
Package:
0805
Key Attributes
Model Number:
WQCF2012Z0M181PB
Product Description
WQCF2012 Series Common Mode Choke
The WQCF2012 Series is a wire-wound common mode choke designed for noise suppression. It features excellent solderability and is AEC-Q200 certified, making it suitable for demanding automotive applications. This choke is ideal for filtering USB lines in personal computers and peripherals, as well as for USB 2.0, IEEE1394, and LVDS interfaces.
Product Attributes
- Brand: Not specified
- Origin: Not specified
- Material: Not specified
- Color: Not specified
- Certifications: AEC-Q200
Technical Specifications
| Series | Dimensions (mm) | Inductance ( @100MHz 20%) | DCR MAX. () | RATE CURRENT (mA) | Cut-off Frequency (GHz) TYP. | Rated Voltage (Vdc) | Withstand Voltage (Vdc) | Insulation Resistance @125VDC (MOHM) MIN. | Packing Code |
| WQCF2012Z0M670PB | 2.0 x 1.2 | 67 | 0.25 | 400 | 1.0 | 50 | 125 | 10 | P |
| WQCF2012Z0M750PB | 2.0 x 1.2 | 75 | 0.30 | 400 | 1.0 | 50 | 125 | 10 | P |
| WQCF2012Z0M900PB | 2.0 x 1.2 | 90 | 0.35 | 330 | 1.0 | 50 | 125 | 10 | P |
| WQCF2012Z0M101PB | 2.0 x 1.2 | 100 | 0.35 | 330 | 1.0 | 50 | 125 | 10 | P |
| WQCF2012Z0M121PB | 2.0 x 1.2 | 120 | 0.30 | 370 | 1.0 | 50 | 125 | 10 | P |
| WQCF2012Z0M161PB | 2.0 x 1.2 | 160 | 0.35 | 350 | 1.0 | 50 | 125 | 10 | P |
| WQCF2012Z0M181PB | 2.0 x 1.2 | 180 | 0.35 | 330 | 1.0 | 50 | 125 | 10 | P |
| WQCF2012Z0M201PB | 2.0 x 1.2 | 200 | 0.40 | 300 | 1.0 | 50 | 125 | 10 | P |
| WQCF2012Z0M221PB | 2.0 x 1.2 | 220 | 0.40 | 300 | 1.0 | 50 | 125 | 10 | P |
| WQCF2012Z0M261PB | 2.0 x 1.2 | 260 | 0.40 | 300 | 1.0 | 50 | 125 | 10 | P |
| WQCF2012Z0M361PB | 2.0 x 1.2 | 360 | 0.50 | 300 | 1.0 | 50 | 125 | 10 | P |
| WQCF2012Z0M371PB | 2.0 x 1.2 | 370 | 0.45 | 280 | 1.0 | 50 | 125 | 10 | P |
| WQCF2012Z0M431PB | 2.0 x 1.2 | 430 | 0.55 | 280 | 1.0 | 50 | 125 | 10 | P |
| WQCF2012Z0M601PB | 2.0 x 1.2 | 600 | 0.60 | 240 | 1.0 | 50 | 125 | 10 | P |
| WQCF2012Z0M751PB | 2.0 x 1.2 | 750 | 0.90 | 220 | 1.0 | 50 | 125 | 10 | P |
Reliability Performance
| Test Item | Test Condition | Standard |
| High Temperature Exposure (Storage) | 1000 hrs. at rated operating temperature (Unpowered). Measurement at 244 hours after test conclusion. | MIL-STD-202 Method 108 |
| Temperature Cycling | 1000 cycles (-40C to +125C). 30min maximum dwell time at each temperature extreme. 1 min. maximum transition time. Measurement at 244 hours after test conclusion. | JESD22 Method JA-104 |
| Biased Humidity | 1000 hours 85C/85%RH. Unpowered. Measurement at 244 hours after test conclusion. | MIL-STD-202 Method 103 |
| Operational Life | 1000 hrs. @ 105C. Measurement at 244 hours after test conclusion. | MIL-PRF-27 |
| Mechanical Shock | Condition C, Peak Value: 100gs, Duration: 6ms, Waveform: Half-sine Velocity Change: 12.3ft/sec | MIL-STD-202 Method 213 |
| Vibration | 5g's for 20 minutes, 12 cycles each of 3 orientations. Test from 10-2000 Hz. | MIL-STD-202 Method 204 |
| Resistance to Soldering Heat | Condition B No pre-heat of samples. Single Wave Solder - Procedure 2 for SMD and Procedure 1 for Leaded with solder within 1.5mm of device body. | MIL-STD-202 Method 210 |
| ESD Passive Component Human Body Model (HBM) | Electrostatic Discharge (ESD) Test. Only direct contact discharge, record the voltage value what the sample can pass. | AEC-Q200-002 Or ISO/DIS10605 |
| Solderability | Leaded: Method A @ 235C, category 3. SMD: a) Method B, 4 hrs @ 155C dry heat @ 235C b) Method B @ 215C category 3. c) Method D category 3 @ 260C. Electrical Test not required. Magnification 50X. | J-STD-002 |
| Flammability | V-0 or V-1 Acceptable | UL-94 |
| Board Flex | 60 sec minimum holding time. | AEC-Q200-005 |
| Terminal Strength (SMD) | Force of 900g for 60 seconds. | AEC-Q200-006 |
2410301733_Walsin-WQCF2012Z0M181PB_C3248310.pdf
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