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quality Crystal Unit SMD 2.0x1.6 24 MHz TST TZ3261C for Wireless Communication and Mobile Device Integration factory
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quality Crystal Unit SMD 2.0x1.6 24 MHz TST TZ3261C for Wireless Communication and Mobile Device Integration factory
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Specifications
Normal temperature Frequency Tolerance:
±10ppm
Operating Temperature:
-40℃~+125℃
Load Capacitance:
8pF
Frequency:
24MHz
Mfr. Part #:
TZ3261C
Package:
SMD2016-4P
Key Attributes
Model Number: TZ3261C
Product Description

TAI-SAW TECHNOLOGY CO., LTD. - Crystal Unit SMD 2.0x1.6 24.0MHz

Product Description: This document details the TAI-SAW TECHNOLOGY CO., LTD. Crystal Unit SMD 2.0x1.6 24.0MHz, model TZ3261C. Designed for wireless communications devices, this ultra-miniature, surface-mount crystal unit offers excellent reliability and good frequency stability over temperature. It is particularly suited for applications requiring compact form factors for mobility.

Features:

  • Surface Mount Hermetic Package
  • Excellent Reliability Performance
  • Good Frequency Perturbation and Stability over temperature
  • Ultra Miniature Package
  • AEC-Q200 compliance
  • Moisture Sensitivity Level (MSL) : Level-1

Applications: Primarily used in wireless communications devices where an ultra-miniature package is essential for mobility.

Product Attributes

  • Brand: TAI-SAW TECHNOLOGY CO., LTD.
  • Part Number: TZ3261C
  • Origin: Taiwan, R.O.C.
  • Certifications: AEC-Q200 compliance, RoHS Compliant, Lead-free
  • Package Type: SMD 2.0x1.6
  • Marking: Laser Marking (Line 1: XX; Frequency (24); Line 2: T; Traceable Code + D; date Code of Year/Month)
  • Unit Weight: 5.7mg+/-0.5mg

Technical Specifications

Specification Value Notes
Nominal Frequency 24.000000 MHz
Mode of Oscillation Fundamental
Storage Temperature Range -40C to +125C
Operating Temperature Range -40C to +125C
Frequency Stability over Operating Temperature Range +/-50 ppm (referred to the value at 25C)
Frequency Make Tolerance (FL) +/-10 ppm @ 25C +/- 3C
Equivalent Series Resistance (ESR) 80 max
Nominal Drive Level 50uW typical and 200uW max
Shunt Capacitance (Co) 3.0 pF max
Load Capacitance (CL) 8 pF
Aging +/-2 ppm/year
Insulation Resistance 500 M min. /DC 100V
Soldering Lead-free soldering
Reflow Profile - Max Peak Temperature 260+/-5 deg C Time: 10+/-2 sec
Reflow Profile - Temperature 217+/-5 deg C Time: 90~100 sec

Reliability Specifications (AEC-Q200)

Test Name Test Process / Method Conditions
Soldering heat EIAJ ED-4701 (IR-reflow) -300(301)M(II) Resistance to Temp./ Duration : 265C /10sec 2 times; Total time : 4min.
Vibration MIL-STD 202G method 204 Total peak amplitude : 1.5mm; Vibration frequency : 10 to 2000 Hz; Sweep period : 20 minute; Vibration directions : 3 mutually perpendicular
Shock MIL-STD 202G method 213 Acceleration : 6000g's, +20/-0 %; Duration : 0.3 ms (total 18 shocks); Waveform : Half-sine
Solderability J-STD-002 Solder Temperature:2655C; Duration time: 50.5 seconds.
Thermal Shock MIL-STD 883G method 1010.8 -55 (30min) 125 (30min); cycle time : 1000 times
Humidity test MIL-STD 202G method 103 Temperature : 85 2 C; Relative humidity : 85%; Duration : 1000 hours
Dry heat (Aging test) MIL-STD 202G method 108A Temperature : 125 2 C; Duration : 1000 hours
Cold resistance (Low Temp Storage) IEC 60068-2-1 Temperature : -40 3 C; Duration : 1000 hours

2410121243_TST-TZ3261C_C18221412.pdf
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