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Specifications
Mfr. Part #:
8W30000P33XCA
Package:
SMD3225-4P
Key Attributes
Model Number:
8W30000P33XCA
Product Description
Product Overview
The 8W Series is a Surface Mount Device (SMD) Temperature Compensated Crystal Oscillator (TCXO) module designed for applications requiring precise frequency control. This module offers stable performance across a wide temperature range and features a clipped sine wave output. It is suitable for various electronic systems where accurate timing is critical.
Product Attributes
- Brand: SJK (implied by P N/ SJK)
- Product Type: Temperature Compensated Crystal Oscillator (TCXO) Module
- Package Type: SMD
- Certifications: RoHS, REACH, HF
- Moisture Sensitivity Level: Level 1 (A1)
- Carrier Type: Reel
Technical Specifications
| Parameter | Condition | Min | Typ | Max | Units | Notes |
|---|---|---|---|---|---|---|
| Supply Voltage | 3.135 | 3.3 | 3.465 | V | ||
| Nominal Frequency | 30.000 | MHz | ||||
| Operating Temperature Range | -40 | 85 | ||||
| Output Level | 0.8 | Vp-p | Clipped sine wave | |||
| Current Drain | 2 | mA | ||||
| Output Load Resistance | 10 | k | ||||
| Output Load Capacitance | 10 | Pf | ||||
| Frequency Tolerance | 2.0 | 0.2 | ppm | vs:Load 10k/10pF | ||
| Frequency Stability vs:Temperature | -40 ~ 85 | 2.5 | ppm | |||
| Frequency Stability vs:Supply Voltage | VDD5% | 0.2 | ppm | |||
| Aging | 1.0 | ppm/5year | ||||
| Start-up Time | 3.0 | ms | ||||
| Storage Temperature | -40 | 85 | ||||
| Phase Noise | at 1KHz offset | -130 | dBc/Hz | |||
| Harmonics | -5 | dBc | ||||
| Dimensions (L x W x H) | 3.2 x 2.5 x 1.0 | mm | ||||
| Part Number (P N/ SJK) | 8W30000P33XCA | |||||
| Minimum Packaging | 3000 | pcs/real |
Dimensions
3.2 2.5 1.0 mm
Reliability Test Specifications
| Test Item | Equipment | Condition | Specification |
|---|---|---|---|
| SOLDERABILITY TEST | SJK-REL001RC-328A | TP:260 TsMax200 TsMin150 2 time | MIL-STD-883E Method 2003.7 |
| HERMETICITY TEST | HELIOT-306S | Pressurized 0.4~0.5Mpa ethanol sealed tank for 10 minutes | MIL-STD-883E Method 1014.10 |
| VIBRATION TEST | HG-V4S&A 250B | Enable Crystal(10g) from 10-55- 10Hz,XYZ horizontal,1 Minute vibration/time, 1time/ 2 hours. | MIL-STD-883E Method 2007.3 |
| MECHANICAL SHOCK | HPC-200S&A 250B | Enable Crystal 50G(490m/s2) time=11 ms speed=3.4 m/s half sine wave oscillation | JIS C6701 |
| DROP TEST | HARD BOARD.S&A250B | 75cm High,3 times on hard board | MIL-STD-202F Method 213B |
| HIGH&LOW TEMP STORAGE TEST(Static test) | H-PTH-80CK & HM101- 3ABNS&A 350B/250B | High temperature: 1252 ,1000hrLow temperature:-403 ,1000hrs | MIL-STD883C, METHOD 1011.8 |
| TEMP &HUM CYCLING TEST | H-PTH-80CK CHAMBE S&A 350B/250B | Temperature:-102652 ,Humidity:933%,1 cycle need 24 hrs. 5cycles. | MIL-STD-883E Method 1005.8 |
| HIGH TEM. & HUM.STORAGE TEST | H-PTH-80CK CHAMBE S&A350B/250B | Temperature:852 Humidity:85+3,-2%,Store 96 hrs | JIS C6701 |
| AGING TEST | H-PTH-80CK CHAMBE S&A350B/250 | Temperature:852Store 1000 hrs | JIS C5023 |
2509281500_SJK-8W30000P33XCA_C51966248.pdf
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