Product Overview
The Si510/511 Crystal Oscillator (XO) from Silicon Laboratories leverages advanced DSPLL technology to provide any frequency output from 100 kHz to 250 MHz. Utilizing a single fixed crystal and a proprietary DSPLL synthesizer, this IC-based solution offers enhanced reliability, improved mechanical robustness, and excellent stability. It features superior supply noise rejection, simplifying low jitter clock generation in noisy environments. Crystal ESR and DLD are individually production-tested for guaranteed performance. The Si510/511 is factory-configurable for various user specifications, including frequency, supply voltage, output format, and stability, eliminating long lead times and NRE charges.
Product Attributes
- Brand: Silicon Laboratories
- Technology: DSPLL
- Certifications: Pb-free, RoHS compliant
Technical Specifications
| Parameter | Symbol | Test Condition | Min | Typ | Max | Unit | Notes |
| Operating Specifications | |||||||
| Supply Voltage | VDD | 3.3 V option | 2.97 | 3.3 | 3.63 | V | |
| 2.5 V option | 2.25 | 2.5 | 2.75 | V | |||
| 1.8 V option | 1.71 | 1.8 | 1.89 | V | |||
| Supply Current | IDD | CMOS, 100 MHz, single-ended | 21 | 26 | mA | ||
| LVDS (output enabled) | 19 | 23 | mA | ||||
| LVPECL (output enabled) | 39 | 43 | mA | ||||
| HCSL (output enabled) | 41 | 44 | mA | ||||
| Tristate (output disabled) | 18 | mA | |||||
| OE "1" Setting | VIH | See Note | 0.80 x VDD | V | Active high and active low polarity OE options available. Active high option includes an internal pull-up. Active low option includes an internal pull-down. | ||
| OE "0" Setting | VIL | See Note | 0.20 x VDD | V | |||
| OE Internal Pull-Up/Pull-Down Resistor | RI | 45 | k | ||||
| Operating Temperature | TA | 40 | 85 | C | |||
| Output Clock Frequency Characteristics | |||||||
| Nominal Frequency | FO | CMOS, Dual CMOS | 0.1 | 212.5 | MHz | ||
| LVDS/LVPECL/HCSL | 0.1 | 250 | MHz | ||||
| Total Stability | Frequency Stability Grade C | 30 | +30 | ppm | Includes initial accuracy, operating temperature, supply voltage change, load change, shock and vibration (not under operation), and 10 years aging at 40 C. | ||
| Frequency Stability Grade B | 50 | +50 | ppm | ||||
| Frequency Stability Grade A | 100 | +100 | ppm | ||||
| Temperature Stability | Frequency Stability Grade C | 20 | +20 | ppm | |||
| Frequency Stability Grade B | 25 | +25 | ppm | ||||
| Frequency Stability Grade A | 50 | +50 | ppm | ||||
| Startup Time | TSU | Minimum VDD until output frequency (FO) within specification | 10 | ms | |||
| Disable Time | TD | FO 10 MHz | 5 | s | |||
| FO < 10 MHz | 40 | s | |||||
| Enable Time | TE | FO 10 MHz | 20 | s | |||
| FO < 10 MHz | 60 | s | |||||
| Output Clock Levels and Symmetry | |||||||
| CMOS Output Logic High | VOH | 0.85 x VDD | V | ||||
| CMOS Output Logic Low | VOL | 0.15 x VDD | V | ||||
| CMOS Output Rise/Fall Time (20 to 80% VDD) | TR/TF | 0.1 to 212.5 MHz, CL = 15 pF | 0.45 | 0.8 | 1.2 | ns | |
| 0.1 to 212.5 MHz, CL = no load | 0.3 | 0.6 | 0.9 | ns | |||
| LVPECL Output Rise/Fall Time (20 to 80% VDD) | TR/TF | 100 MHz 250 MHz | 565 | ps | |||
| HCSL Output Rise/Fall Time (20 to 80% VDD) | TR/TF | 100 MHz 250 MHz | 470 | ps | |||
| LVDS Output Rise/Fall Time (20 to 80% VDD) | TR/TF | 100 MHz 250 MHz | 350 | 800 | ps | ||
| LVPECL Output Common Mode | VOC | 50 to VDD 2 V, single-ended | VDD 1.4 V | V | |||
| LVPECL Output Swing | VO | 50 to VDD 2 V, single-ended | 0.55 | 0.8 | 0.90 | VPPSE | |
| LVDS Output Common Mode | VOC | 100 line-line, VDD = 3.3/2.5 V | 1.13 | 1.23 | 1.33 | V | |
| 100 line-line, VDD = 1.8 V | 0.83 | 0.92 | 1.00 | V | |||
| LVDS Output Swing | VO | Single-ended, 100 differential termination | 0.25 | 0.35 | 0.45 | VPPSE | |
| HCSL Output Common Mode | VOC | 50 to ground | 0.35 | 0.38 | 0.42 | V | |
| HCSL Output Swing | VO | Single-ended | 0.58 | 0.73 | 0.85 | VPPSE | |
| Duty Cycle | DC | All formats | 48 | 50 | 52 | % | |
| Output Clock Jitter and Phase Noise (LVPECL) | |||||||
| Period Jitter (RMS) | JPRMS | 10k samples | 1.3 | ps | Applies to specific output frequencies. | ||
| Period Jitter (Pk-Pk) | JPPKPK | 10k samples | 11 | ps | Applies to specific output frequencies. | ||
| Phase Jitter (RMS) | J | 1.875 MHz to 20 MHz integration bandwidth (brickwall) | 0.31 | 0.5 | ps | Applies to specific output frequencies. | |
| 12 kHz to 20 MHz integration bandwidth (brickwall) | 0.8 | 1.0 | ps | ||||
| Phase Noise, 156.25 MHz | N | 100 Hz | 86 | dBc/Hz | |||
| 1 kHz | 109 | dBc/Hz | |||||
| 10 kHz | 116 | dBc/Hz | |||||
| 100 kHz | 123 | dBc/Hz | |||||
| 1 MHz | 136 | dBc/Hz | |||||
| Additive RMS Jitter Due to External Power Supply Noise | JPSR | 10 kHz sinusoidal noise | 3.0 | ps | 156.25 MHz. Increase in jitter on output clock due to sinewave noise added to VDD (100 mVPP). | ||
| 100 kHz sinusoidal noise | 3.5 | ps | |||||
| 500 kHz sinusoidal noise | 3.5 | ps | |||||
| 1 MHz sinusoidal noise | 3.5 | ps | |||||
| Spurious | SPR | LVPECL output, 156.25 MHz, offset>10 kHz | 75 | dBc | |||
| Output Clock Jitter and Phase Noise (LVDS) | |||||||
| Period Jitter (RMS) | JPRMS | 10k samples | 2.1 | ps | Applies to specific output frequencies. | ||
| Period Jitter (Pk-Pk) | JPPKPK | 10k samples | 18 | ps | Applies to specific output frequencies. | ||
| Phase Jitter (RMS) | J | 1.875 MHz to 20 MHz integration bandwidth (brickwall) | 0.25 | 0.55 | ps | Applies to specific output frequencies. | |
| 12 kHz to 20 MHz integration bandwidth (brickwall) | 0.8 | 1.0 | ps | ||||
| Phase Noise, 156.25 MHz | N | 100 Hz | 86 | dBc/Hz | |||
| 1 kHz | 109 | dBc/Hz | |||||
| 10 kHz | 116 | dBc/Hz | |||||
| 100 kHz | 123 | dBc/Hz | |||||
| 1 MHz | 136 | dBc/Hz | |||||
| Spurious | SPR | LVPECL output, 156.25 MHz, offset>10 kHz | 75 | dBc | |||
2410121928_SILICON-LABS-511BBA200M000BAGR_C1987332.pdf
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