Skyworks Si535/536 Ultra Low Jitter Crystal Oscillator (XO)
The Si535/536 XO utilizes Skyworks Solutions advanced DSPLL circuitry to provide an ultra low jitter clock at high-speed differential frequencies. Unlike traditional XOs requiring a different crystal for each output frequency, the Si535/536 uses one fixed crystal to generate a wide range of output frequencies. This IC-based approach ensures exceptional frequency stability and reliability. The DSPLL clock synthesis offers superior supply noise rejection, simplifying the generation of low jitter clocks in noisy communication system environments. The IC-based XO is factory programmed, eliminating long lead times associated with custom oscillators.
Product Attributes
- Brand: Skyworks Solutions, Inc.
- Technology: DSPLL circuitry
- Package: 5 x 7 mm
- Compliance: Pb-free/RoHS-compliant
Technical Specifications
| Parameter | Symbol | Test Condition | Min | Typ | Max | Unit | Notes |
| Recommended Operating Conditions | |||||||
| Supply Voltage (3.3 V option) | VDD | 2.97 | 3.3 | 3.63 | V | Selectable parameter specified by part number. | |
| Supply Voltage (2.5 V option) | VDD | 2.25 | 2.5 | 2.75 | V | Selectable parameter specified by part number. | |
| Supply Current (Output enabled, LVPECL) | IDD | 111 | 121 | mA | |||
| Supply Current (Output enabled, LVDS) | IDD | 90 | 98 | mA | |||
| Supply Current (Tristate mode) | IDD | 60 | 75 | mA | |||
| Output Enable (OE) VIH | VIH | 0.75 x VDD | V | OE pin includes a 17 k pullup resistor to VDD. | |||
| Output Enable (OE) VIL | VIL | 0.5 | V | OE pin includes a 17 k pullup resistor to VDD. | |||
| Operating Temperature Range | TA | 40 | 85 | C | |||
| CLK Output Frequency Characteristics | |||||||
| Nominal Frequency | fO | LVPECL/LVDS | 100 | 312.5 | MHz | See Section 3. "Ordering Information" for available frequencies. | |
| Initial Accuracy | fi | Measured at +25 C at time of shipping | 1.5 | ppm | |||
| Temperature Stability (20 ppm) | 20 | +20 | ppm | Selectable parameter specified by part number. | |||
| Temperature Stability (7 ppm) | 7 | +7 | ppm | Selectable parameter specified by part number. | |||
| Aging (1st year) | fa | Frequency drift over first year | 3 | ppm | |||
| Aging (20 year life) | fa | Frequency drift over 20 year life | 10 | ppm | |||
| Total Stability (Temp stability = 20 ppm) | 31.5 | ppm | |||||
| Total Stability (Temp stability = 7 ppm) | 20 | ppm | |||||
| Powerup Time | tOSC | TA = 40C to +85C | 10 | ms | Time from powerup or tristate mode to fO. | ||
| CLK Output Levels and Symmetry | |||||||
| LVPECL Mid-level Output Voltage | VO | 50 to VDD 2.0 V | VDD 1.42 | VDD 1.25 | V | ||
| LVPECL Differential Swing | VOD | 1.1 | 1.9 | VPP | |||
| LVDS Mid-level Output Voltage | VO | Rterm = 100 (differential) | 1.125 | 1.20 | 1.275 | V | |
| LVDS Differential Swing | VOD | Rterm = 100 (differential) | 0.5 | 0.7 | 0.9 | VPP | |
| Rise/Fall time (20/80%) | tR, tF | 350 | ps | ||||
| Symmetry (duty cycle) Differential | SYM | 45 | 55 | % | |||
| CLK Output Phase Jitter | |||||||
| Phase Jitter* (RMS, 10 kHz to 1 MHz) | J | Data center | 0.19 | 0.35 | ps | Applies to output frequencies: 156.25 MHz. | |
| Phase Jitter* (RMS, 12 kHz to 20 MHz) | J | Brickwall | 0.25 | 0.40 | ps | Applies to output frequencies: 156.25 MHz. | |
| CLK Output Period Jitter | |||||||
| Period Jitter* (RMS) | JPER | N = 1000 cycles | 2 | ps | |||
| Period Jitter* (Peak-to-Peak) | JPER | N = 1000 cycles | 14 | ps | |||
| Environmental Compliance | |||||||
| Mechanical Shock | MIL-STD-883, Method 2002 | ||||||
| Mechanical Vibration | MIL-STD-883, Method 2007 | ||||||
| Solderability | MIL-STD-883, Method 2003 | ||||||
| Gross & Fine Leak | MIL-STD-883, Method 1014 | ||||||
| Resistance to Solder Heat | MIL-STD-883, Method 2036 | ||||||
| Moisture Sensitivity Level | J-STD-020, MSL1 | ||||||
| Contact Pads | Gold over Nickel | ||||||
| Thermal Characteristics (Typical values TA = 25 C, VDD = 3.3 V) | |||||||
| Thermal Resistance Junction to Ambient | JA | Still Air | 84.6 | C/W | |||
| Thermal Resistance Junction to Case | JC | Still Air | 38.8 | C/W | |||
| Ambient Temperature | TA | 40 | 85 | C | |||
| Junction Temperature | TJ | 125 | C | ||||
| Absolute Maximum Ratings | |||||||
| Maximum Operating Temperature | TAMAX | 85 | C | Stresses beyond those listed may cause permanent damage. | |||
| Supply Voltage, 2.5/3.3 V Option | VDD | 0.5 | +3.8 | V | Stresses beyond those listed may cause permanent damage. | ||
| Input Voltage (any input pin) | VI | 0.5 | VDD + 0.3 | V | Stresses beyond those listed may cause permanent damage. | ||
| Storage Temperature | TS | 55 | +125 | C | Stresses beyond those listed may cause permanent damage. | ||
| ESD Sensitivity (HBM, per JESD22-A114) | ESD | 2500 | V | ||||
| Soldering Temperature (Pb-free profile) | TPEAK | 260 | C | Compliant with JEDEC J-STD-020C. | |||
| Soldering Temperature Time @ TPEAK (Pb-free profile) | tP | 2040 | seconds | Compliant with JEDEC J-STD-020C. | |||
2508281722_SILICON-LABS-535AB106M250DGR_C2030253.pdf
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