Product Overview
The Si510/511 Crystal Oscillator (XO) from Silicon Laboratories utilizes advanced DSPLL technology to provide any frequency from 100 kHz to 250 MHz using a single fixed crystal. This IC-based approach enhances reliability, mechanical robustness, and stability while offering superior supply noise rejection for low jitter clock generation in noisy environments. The device is factory-configurable for various user specifications, including frequency, supply voltage, output format, and stability, with short lead times and no NRE charges.
Product Attributes
- Brand: Silicon Laboratories
- Technology: DSPLL
- Certifications: Pb-free, RoHS compliant
- Packaging: 5 x 7 mm, 3.2 x 5 mm, and 2.5 x 3.2 mm
- Operation Temperature: 40 to 85 C
Technical Specifications
| Parameter | Symbol | Test Condition | Min | Typ | Max | Unit | Notes |
| Operating Specifications | |||||||
| Supply Voltage | VDD | 3.3 V option | 2.97 | 3.3 | 3.63 | V | |
| 2.5 V option | 2.25 | 2.5 | 2.75 | V | |||
| 1.8 V option | 1.71 | 1.8 | 1.89 | V | |||
| Supply Current | IDD | CMOS, 100 MHz, single-ended | 21 | 26 | mA | ||
| LVDS (output enabled) | 19 | 23 | mA | ||||
| LVPECL (output enabled) | 39 | 43 | mA | ||||
| HCSL (output enabled) | 41 | 44 | mA | ||||
| Tristate (output disabled) | 18 | mA | |||||
| OE Setting | VIH | OE "1" | 0.80 x VDD | V | Active high and active low polarity OE options available. Active high option includes an internal pull-up. Active low option includes an internal pull-down. | ||
| VIL | OE "0" | 0.20 x VDD | V | ||||
| OE Internal Resistor | RI | 45 | k | ||||
| Operating Temperature | TA | 40 | 85 | C | |||
| Output Clock Frequency Characteristics | |||||||
| Nominal Frequency | FO | CMOS, Dual CMOS | 0.1 | 212.5 | MHz | ||
| FO | LVDS/LVPECL/HCSL | 0.1 | 250 | MHz | |||
| Total Stability | Grade C | 30 | +30 | ppm | Includes initial accuracy, operating temperature, supply voltage change, load change, shock and vibration (not under operation), and 10 years aging at 40 C. | ||
| Grade B | 50 | +50 | ppm | ||||
| Grade A | 100 | +100 | ppm | ||||
| Temperature Stability | Grade C | 20 | +20 | ppm | |||
| Grade B | 25 | +25 | ppm | ||||
| Grade A | 50 | +50 | ppm | ||||
| Startup Time | TSU | Minimum VDD until output frequency (FO) within specification | 10 | ms | |||
| Disable Time | TD | FO 10 MHz | 5 | s | |||
| FO < 10 MHz | 40 | s | |||||
| Enable Time | TE | FO 10 MHz | 20 | s | |||
| FO < 10 MHz | 60 | s | |||||
| Output Clock Levels and Symmetry | |||||||
| CMOS Output Logic High | VOH | 0.85 x VDD | V | ||||
| CMOS Output Logic Low | VOL | 0.15 x VDD | V | ||||
| CMOS Output Rise/Fall Time | TR/TF | 0.1 to 212.5 MHz, CL = 15 pF | 0.45 | 0.8 | 1.2 | ns | |
| 0.1 to 212.5 MHz, CL = no load | 0.3 | 0.6 | 0.9 | ns | |||
| LVPECL Output Rise/Fall Time | TR/TF | 100 | 565 | ps | |||
| HCSL Output Rise/Fall Time | TR/TF | 100 | 470 | ps | |||
| LVDS Output Rise/Fall Time | TR/TF | 350 | 800 | ps | |||
| LVPECL Output Common Mode | VOC | 50 to VDD 2 V, single-ended | VDD 1.4 V | V | |||
| LVPECL Output Swing | VO | 50 to VDD 2 V, single-ended | 0.55 | 0.8 | 0.90 | VPPSE | |
| LVDS Output Common Mode | VOC | 100 line-line, VDD = 3.3/2.5 V | 1.13 | 1.23 | 1.33 | V | |
| 100 line-line, VDD = 1.8 V | 0.83 | 0.92 | 1.00 | V | |||
| LVDS Output Swing | VO | Single-ended, 100 differential termination | 0.25 | 0.35 | 0.45 | VPPSE | |
| HCSL Output Common Mode | VOC | 50 to ground | 0.35 | 0.38 | 0.42 | V | |
| HCSL Output Swing | VO | Single-ended | 0.58 | 0.73 | 0.85 | VPPSE | |
| Duty Cycle | DC | All formats | 48 | 50 | 52 | % | |
| Output Clock Jitter and Phase Noise (LVPECL) | |||||||
| Period Jitter (RMS) | JPRMS | 10k samples | 1.3 | ps | Applies to output frequencies: 74.17582, 74.25, 75, 77.76, 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25, 212.5, 250 MHz. | ||
| Period Jitter (Pk-Pk) | JPPKPK | 10k samples | 11 | ps | |||
| Phase Jitter (RMS) | J | 1.875 MHz to 20 MHz integration bandwidth (brickwall) | 0.31 | 0.5 | ps | Applies to output frequencies: 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25, 212.5 and 250 MHz. | |
| 12 kHz to 20 MHz integration bandwidth (brickwall) | 0.8 | 1.0 | ps | ||||
| Phase Noise, 156.25 MHz | N | 100 Hz | 86 | dBc/Hz | |||
| 1 kHz | 109 | dBc/Hz | |||||
| 10 kHz | 116 | dBc/Hz | |||||
| 100 kHz | 123 | dBc/Hz | |||||
| 1 MHz | 136 | dBc/Hz | |||||
| Additive RMS Jitter Due to External Power Supply Noise | JPSR | 10 kHz sinusoidal noise | 3.0 | ps | 156.25 MHz. Increase in jitter on output clock due to sinewave noise added to VDD (2.5/3.3 V = 100 mVPP). | ||
| 100 kHz sinusoidal noise | 3.5 | ps | |||||
| 500 kHz sinusoidal noise | 3.5 | ps | |||||
| 1 MHz sinusoidal noise | 3.5 | ps | |||||
| Spurious | SPR | LVPECL output, 156.25 MHz, offset>10 kHz | 75 | dBc | |||
| Output Clock Jitter and Phase Noise (LVDS) | |||||||
| Period Jitter (RMS) | JPRMS | 10k samples | 2.1 | ps | Applies to output frequencies: 74.17582, 74.25, 75, 77.76, 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25, 212.5, 250 MHz. | ||
| Period Jitter (Pk-Pk) | JPPKPK | 10k samples | 18 | ps | |||
| Phase Jitter (RMS) | J | 1.875 MHz to 20 MHz integration bandwidth (brickwall) | 0.25 | 0.55 | ps | Applies to output frequencies: 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25, 212.5 and 250 MHz. | |
| 12 kHz to 20 MHz integration bandwidth (brickwall) | 0.8 | 1.0 | ps | ||||
| Phase Noise, 156.25 MHz | N | 100 Hz | 86 | dBc/Hz | |||
| 1 kHz | 109 | dBc/Hz | |||||
| 10 kHz | 116 | dBc/Hz | |||||
| 100 kHz | 123 | dBc/Hz | |||||
| 1 MHz | 136 | dBc/Hz | |||||
| Spurious | SPR | LVPECL output, 156.25 MHz, offset>10 kHz | 75 | dBc | |||
2410121928_SILICON-LABS-510BBA100M000BAG_C1671193.pdf
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