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quality High Power Metal Alloy Chip Resistors PAKER RA1206F1R008G with Low TCR and Halogen Free Packaging factory
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quality High Power Metal Alloy Chip Resistors PAKER RA1206F1R008G with Low TCR and Halogen Free Packaging factory
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Specifications
Mfr. Part #:
RA1206F1R008G
Package:
1206
Key Attributes
Model Number: RA1206F1R008G
Product Description

Product Overview

The RAxxx Series Metal Alloy Current Sensing Chip Resistors from Pakermicro (Shenzhen) Co., Ltd. are designed for high stability and reliability in demanding applications. These resistors feature ultra-low resistance values, excellent temperature coefficient characteristics, and high power ratings up to 3 watts. They are constructed with a metal alloy element and housed in an epoxy plastic package (UL: 94V-0). These resistors are halogen-free, RoHS compliant, and Pb-free, meeting AEC-Q200 provisions. Key applications include automotive electronics, current sensing, mobile phones, computers, power supplies, and battery chargers.

Product Attributes

  • Brand: Pakermicro
  • Origin: Shenzhen, China
  • Material: Metal Alloy
  • Package: Plastic Package Epoxy (UL: 94V-0)
  • Compliance: Halogen free, RoHS compliant, Pb free, AEC-Q200 relevant provisions
  • Mounting Position: Any
  • Marking: 4 digits for 0.5%, 1%, 2%, 3%, 5% tolerance products (First letter 'R' denotes 10, others declare resistance).

Technical Specifications

Model Rated Power Resistance Range TCR (ppm/) Insulation Resistance Operating Temperature Range Dimensions (L x W x T) mm Electrode Size (E) mm
RA1206 1W 1m~100m (D, F, G, H, J) 1m: 350; 2m~100m: 50 >100M -55~+170 3.20.20 x 1.60.20 x 0.600.20 0.500.20
1/2W 110m~200m 50
RA2512 2W, 3W 0.5m~500m 0.5 m, 1m: 350; 2m~500m: 50 6.40.20 x 3.20.20 x 0.800.20 :2.200.20; :0.900.20
RA0805 1/4W, 1/2W 1m (350); 2m~20m (50) 1m: 350; 2m~20m: 50 >100M -55~+170 2.00.10 x 1.250.10 x 0.600.20 0.400.20

Performance Reliability Test Methods

Test Item Test Methods Test Conditions R% (Max)
Temperature Coefficient IEC60115-1 4.8 TCR=(R-R0)/(t-t0)R0 10 (ppm) < 1% (varies by resistance value)
ESD test AEC-Q200-002 2KV, 2times/1s < 1%
Solderability J-STD-002B test B Dip in flux, then solder bath at 2455 for 2~3sec. < 1%
Resistance to soldering heat IEC60115-1 4.13 Dip in flux, then solder bath at 2605 for 101sec. < 1%
Mechanical Shock MIL-STD-202 METHOD 213 100g's, Normal duration 6ms, half sine shock pulse. < 1%
Terminal Bending AEC-Q200-005 Min 2mm deflection, 60sec. < 1%
Terminal Strength AEC-Q200-006 Applied 17.7N (1.8Kg) for 601seconds. < 1%
Thermal shock MIL-STD-202 METHOD 107 -55/+125C, 1000 Cycles. < 1%
Biased Humidity IEC60115-1 4.23.4 85/85%RH for 1000 hours. < 1%
Operational life IEC60115-1 4.18 10% of operating power, 1000 hours at 85. < 1%
Temperature cycling JESD22 Method JA-104 Devices mounted. Max transfer time 20 seconds. < 1%
Short-time overload MIL-STD-202 METHOD 108 Applied 5.0 times of rated power for 5 seconds. < 1%
High Temperature Exposure MIL-STD-202 METHOD 103 1000 hrs. @T=125. < 1%
Low Temperature operation 45 min. @T=-55 . < 1%
Vibration MIL-STD-202 METHOD 204 5g's for 20min. 12 cycles, 10-2000Hz. < 1%

2511271355_PAKER-RA1206F1R008G_C53054969.pdf

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