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Specifications
Operating Temperature:
-55℃~+125℃
Nominal Capacitance:
2.2nF
Voltage Rating:
50V
Tolerance:
±20%
DC Resistance(DCR):
300mΩ
Current Rating:
1A
Mfr. Part #:
NFM21HC222R1H3D
Package:
SMD-4P,2x1.2mm
Key Attributes
Model Number:
NFM21HC222R1H3D
Product Description
Product Overview
This specification applies to 3 Terminals Low ESL Chip Multilayer Ceramic Capacitors (EMI Filter) designed for automotive powertrain/safety equipment, automotive infotainment/comfort equipment, and medical equipment (excluding implant equipment). These capacitors offer low Equivalent Series Inductance (ESL) and are suitable for applications requiring EMI filtering.
Product Attributes
- Brand: MURATA
- Product Type: 3 Terminals Low ESL Chip Multilayer Ceramic Capacitors (EMI Filter)
- Model Number: NFM21HC222R1H3-0-740
Technical Specifications
| Part Number | Capacitance | Capacitance Tolerance | Rated Voltage | Rated Current | DC Resistance (max.) | Operating Temperature Range | Storage Temperature Range | Package | Packing Quantity |
|---|---|---|---|---|---|---|---|---|---|
| NFM21HC222R1H3-0-740 | 2200pF | +/-20% | DC 50V | DC 1A | 300m | -55 to 125 | -55 to 125 | 2012M(0805) | 4000 pcs./Reel |
Specifications and Test Methods (AEC-Q200 Compliant)
| Item | Specification | Test Method |
|---|---|---|
| Resistance to Soldering Heat | Appearance: No defects or abnormalities. Capacitance Change: Within +/-7.5%. DC Resistance: 500m below. | Solder bath method (Sn-3.0Ag-0.5Cu, 270+/-5, 10+/-1s) |
| Vibration | Appearance: No defects or abnormalities. Capacitance: Within the specified initial value. DC Resistance: 500m below. | Simple harmonic motion 10Hz to 2000Hz to 10Hz, Total amplitude 1.5 mm or Acceleration amplitude 196m/s2 whichever is smaller, 20min |
| Mechanical Shock | Appearance: No defects or abnormalities. Capacitance: Within the specified initial value. DC Resistance: 500m below. | Half-sine waveform, Peak value 1500g, Holding Time 0.5ms, Velocity change 4.7m/s |
| Operational Life | Appearance: No defects or abnormalities. Capacitance Change: Within +/-12.5%. DC Resistance: 500m below. I.R.: More than 1000M. | Test Temperature: Maximum Operating Temperature +/-3, Test Time: 1000+/-12h, Test Voltage: 100% of the rated voltage |
| Biased Humidity | Appearance: No defects or abnormalities. Capacitance Change: Within +/-12.5%. DC Resistance: 500m below. I.R.: More than 1000M. | Test Temperature: 85+/-3, Test Humidity: 80%RH to 85%RH, Test Time: 1000+/-12h |
| Temperature Cycling | Appearance: No defects or abnormalities. Capacitance Change: Within +/-7.5%. DC Resistance: 500m below. I.R.: More than 1000M. | Cycles: 1000cycles |
| High Temperature Exposure (Storage) | Appearance: No defects or abnormalities. Capacitance Change: Within +/-12.5%. DC Resistance: 500m below. I.R.: More than 1000M. | Test Temperature: 150+/-3, Test Time: 1000+/-12h |
| Terminal Strength | Appearance: No defects or abnormalities. | Applied Force: 9.8N |
| Board Flex | Appearance: No defects or abnormalities. Capacitance Change: Within +/-12.5%. DC Resistance: 500m below. | Flexure: 2mm, Holding Time: 30s |
| Voltage proof | Appearance: No defects or abnormalities. DC Resistance: Shown in Rated value. | Test Voltage: 300% of the rated voltage, Applied Time: 1s to 5s |
| Insulation Resistance(I.R.) (Room Temperature) | More than 1000M | Measurement Voltage: Rated Voltage, Charging Time: 2min |
| Capacitance | Shown in Rated value. | Measurement Frequency: 1.0+/-0.1kHz, Measurement Voltage: 1.0+/-0.2Vrms, Immersion time: 5+0/-0.5s |
| ESD | DC Resistance: 500m below. | Per AEC-Q200-002 |
| Solderability | 95% of the terminations is to be soldered evenly and continuously. | Pre-treatment: Heat treatment at 155C for 4hours. Flux: Rosin ethanol 25(mass)%. Solder: Sn-3.0Ag-0.5Cu at 245+/-5 . |
| Beam Load Test | Destruction Value: More than 20N | Stress Load Speed: 0.5mm/s |
2410171625_muRata-NFM21HC222R1H3D_C333861.pdf
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