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quality Automotive EMI Filter Very Large Current Low ESL Multilayer Ceramic Capacitor muRata NFM31HK104R1H3L 3 Terminals factory
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quality Automotive EMI Filter Very Large Current Low ESL Multilayer Ceramic Capacitor muRata NFM31HK104R1H3L 3 Terminals factory
>
Specifications
Operating Temperature:
-55℃~+125℃
Nominal Capacitance:
100nF
Voltage Rating:
50V
Tolerance:
±20%
DC Resistance(DCR):
3mΩ
Current Rating:
6A
Mfr. Part #:
NFM31HK104R1H3L
Package:
SMD-3P,1.6x3.2mm
Key Attributes
Model Number: NFM31HK104R1H3L
Product Description

Product Overview

The MURATA NFM31HK104R1H3 is a Very Large Current 3 Terminals Low ESL Chip Multilayer Ceramic Capacitor designed for EMI filtering in automotive electronic equipment. It offers low ESL and high current handling capabilities, making it suitable for demanding applications.

Product Attributes

  • Brand: MURATA
  • Series: NFM31HK
  • Product Type: Very Large Current 3 Terminals Low ESL Chip Multilayer Ceramic Capacitors (EMI Filter)
  • Application: Automotive Electronic equipment

Technical Specifications

Part NumberCapacitanceCapacitance ToleranceRated VoltageRated CurrentDC Resistance (max.)Operating Temperature RangeStorage Temperature RangePackage Size CodePackagingStandard Packing Quantity
NFM31HK104R1H30.1F+/-20%DC 50VDC 6A3m-55 to 125-55 to 1253216M(1206)180mm Reel Plastic Tape (W8P4)3000 pcs./Reel
Test ItemSpecificationTest Method (Ref. Standard: AEC-Q200)
Resistance to Soldering HeatAppearance: No defects or abnormalities. Capacitance Change: Within +/-7.5% DC Resistance: 50m belowSolder bath method: Sn-3.0Ag-0.5Cu (Lead Free Solder), 270+/-5, 10+/-1s
VibrationAppearance: No defects or abnormalities. Capacitance: Within the specified initial value. DC Resistance: 50m belowSimple harmonic motion 10Hz to 2000Hz to 10Hz, Total amplitude 1.5 mm or Acceleration amplitude 196m/s2 whichever is smaller, 20min per direction, 3 directions
Mechanical ShockAppearance: No defects or abnormalities. Capacitance: Within the specified initial value. DC Resistance: 50m belowHalf-sine waveform, Peak value 1500g, Holding Time 0.5ms, Velocity change 4.7m/s, 3 shocks per direction, 3 directions
Operational LifeAppearance: No defects or abnormalities. Capacitance Change: Within +/-12.5% DC Resistance: 50m below I.R. (Room Temp.): More than 50MMounting method: Solder on test substrate. Test Temperature: Maximum Operating Temperature +/-3. Test Time: 1000+/-12h. Test Voltage: 100% of the rated voltage.
Biased HumidityAppearance: No defects or abnormalities. Capacitance Change: Within +/-12.5% DC Resistance: 50m below I.R. (Room Temp.): More than 50MMounting method: Solder on test substrate. Test Temperature: 85+/-3. Test Humidity: 80%RH to 85%RH. Test Time: 1000+/-12h. Test Voltage: Rated voltage and 1.3+0.2/-0Vdc (add 6.8k resister).
Temperature CyclingAppearance: No defects or abnormalities. Capacitance Change: Within +/-7.5% DC Resistance: 50m below I.R. (Room Temp.): Within the specified initial value.Mounting method: Solder on test substrate. Cycles: 1000 cycles.
High Temperature Exposure (Storage)Appearance: No defects or abnormalities. Capacitance Change: Within +/-12.5% DC Resistance: 50m below I.R. (Room Temp.): More than 50MMounting method: Solder on test substrate. Test Temperature: Maximum Operating Temperature +/-3. Test Time: 1000+/-12h.
Terminal StrengthAppearance: No defects or abnormalities.Applied Force: 9.8N, Holding Time: 30s
Board FlexAppearance: No defects or abnormalities. Capacitance Change: Within +/-7.5% DC Resistance: 50m belowMounting method: Reflow solder on test substrate. Flexure: 1mm, Holding Time: 30s
Voltage proofAppearance: No defects or abnormalities. DC Resistance: Shown in Rated value.Test Voltage: 300% of the rated voltage, Applied Time: 1s to 5s
Insulation Resistance(I.R.) (Room Temperature)More than 1000MMeasurement Voltage: Rated Voltage, Charging Time: 2min
Solderability95% of the terminations is to be soldered evenly and continuously.Pre-treatment: Heat treatment at 155C for 4 hours. Flux: Rosin ethanol 25(mass)%. Solder: Sn-3.0Ag-0.5Cu (Lead Free Solder) at 245+/-5 .
Beam Load TestDestruction value: More than 14.7NSpeed supplied the Stress Load: 0.5mm/s

2412091017_muRata-NFM31HK104R1H3L_C437584.pdf

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