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Specifications
Voltage Rating:
50V
Capacitance:
18pF
Temperature Coefficient:
C0G
Tolerance:
±1%
Mfr. Part #:
GRM1555C1H180FA01D
Package:
0402
Key Attributes
Model Number:
GRM1555C1H180FA01D
Product Description
Product Overview
Chip Multilayer Ceramic Capacitors for General Purpose, suitable for general electronic equipment. This product specification applies to the GRM1555C1H180FA01 model.
Product Attributes
- Brand: MURATA
Technical Specifications
| MURATA Part No. | Size Code | Temperature Characteristics | Rated Voltage | Nominal Capacitance | Capacitance Tolerance | Packaging Code | Dimensions (mm) L/W | Dimensions (mm) T | Packaging Unit |
| GRM1555C1H180FA01 | 0402 | C0G (EIA) | DC 50 V | 18pF | +/- 1 % | D (10000 pcs./Reel, 180mm Reel PAPER Tape) | 0.15 to 0.35 | 0.3 min. | 10000 pcs./Reel |
| GRM1555C1H180FA01 | 0402 | C0G (EIA) | DC 50 V | 18pF | +/- 1 % | J (50000 pcs./Reel, 330mm Reel PAPER Tape) | 0.15 to 0.35 | 0.3 min. | 50000 pcs./Reel |
| GRM1555C1H180FA01 | 0402 | C0G (EIA) | DC 50 V | 18pF | +/- 1 % | A01 (20000 pcs./Reel, 180mm Reel PAPER Tape) | 0.15 to 0.35 | 0.3 min. | 20000 pcs./Reel |
Specifications and Test Methods
General
| Item | Specification | Test Method (Ref. Standard:JIS C 5101, IEC60384) |
| Rated Voltage | Shown in Rated value. The rated voltage is defined as the maximum voltage which may be applied continuously to the capacitor. When AC voltage is superimposed on DC voltage, VP-P or VO-P, whichever is larger, should be maintained within the rated voltage range. | |
| Appearance | No defects or abnormalities. | Visual inspection. |
| Dimension | Shown in Rated value. | Using Measuring instrument of dimension. |
| Voltage Proof | No defects or abnormalities. | Measurement Point : Between the terminations Test Voltage : 300% of the rated voltage Applied Time : 1s to 5s Charge/Discharge Current : 50mA max. |
| Insulation Resistance(I.R.) | More than 10000M | Measurement Temperature:Room Temperature Measurement Point : Between the terminations Measurement Voltage : Rated Voltage Charging Time : 2min Charge/Discharge Current : 50mA max. |
| Capacitance | Shown in Rated value. | Measurement Temperature:Room Temperature Measurement Frequency : 1.0+/-0.1MHz Measurement Voltage : 0.5 to 5.0Vrms |
| Q or Dissipation Factor (D.F.) | Q400+20C (C:Nominal Capacitance(pF)) | Measurement Temperature : Room Temperature Measurement Frequency : 1.0+/-0.1MHz Measurement Voltage : 0.5 to 5.0Vrms |
Temperature Characteristics
| Item | Specification | Test Method (Ref. Standard:JIS C 5101, IEC60384) |
| Capacitance | Nominal value of the temperature coefficient is shown in Rated value. The capacitance change should be measured after 5 minutes at each specified temperature stage. Capacitance Drift:Within +/-0.2% or +/-0.05pF (Whichever is larger) | Measurement Voltage : Less than 1.0Vrms (Refer to the individual data sheet) Step Temperature(C) Applying Voltage 1 Reference Temp. +/-2 2 Min. Operating Temp. +/-3 3 * Reference Temp. +/-2 4 Max. Operating Temp. 3 5 Reference Temp. +/-2 No bias |
Mechanical and Environmental Tests
| Item | Specification | Test Method (Ref. Standard:JIS C 5101, IEC60384) |
| Adhesive Strength of Termination | No removal of the terminations or other defect should occur. | Solder the capacitor on the test substrate shown in Fig.3. Termination Applied Force : 5N Holding Time : 10+/-1 Applied Direction : In parallel with the test substrate and vertical with the capacitor side |
| Vibration | Appearance: No defects or abnormalities. Capacitance: Within the specified initial value. Q or D.F.: Within the specified initial value. | Solder the capacitor on the test substrate shown in Fig.3. Kind of Vibration : A simple harmonic motion 10Hz to 55Hz to 10Hz Vibration Time : 1min Total Amplitude : 1.5mm This motion should be applied for a period of 2hours in each 3 mutually perpendicular directions(total of 6hours). |
| Substrate Bending Test | Appearance: No defects or abnormalities. Capacitance: Within +/-5% or +/-0.5pF (Whichever is larger) | Solder the capacitor on the test substrate shown in Fig.1. Pressurization Method : Shown in Fig.2. Flexure : 1mm Change Holding Time : 5+/-1s Soldering Method : Reflow soldering |
| Solderability | 95% of the terminations is to be soldered evenly and continuously. | Test Method : Solder bath method Flux : Solution of rosin ethanol 25(mass)% Preheat : 80 to 12010s to 30s Solder : Sn-3.0Ag-0.5Cu(Lead Free Solder) Test Temp. : 245+/-5 Test Time : 2+/-0.5s |
| Resistance to Soldering Heat | Appearance: No defects or abnormalities. Capacitance: Within +/-2.5% or +/-0.25pF (Whichever is larger) Q or D.F.: Within the specified initial value. I.R.: Within the specified initial value. Voltage Proof: No defects. | Test Method : Solder bath method Solder : Sn-3.0Ag-0.5Cu(Lead Free Solder) Solder Temp. : 270+/-5 Test Time : 10+/-0.5s Preheat Temp. : 120 to 150 Preheat Time : 1min Post-treatment : Let sit for 24+/-2hours at room temperature, then measure. |
| Temperature Sudden Change | Appearance: No defects or abnormalities. Capacitance: Within +/-2.5% or +/-0.25pF (Whichever is larger) Q or D.F.: Within the specified initial value. I.R.: Within the specified initial value. Voltage Proof: No defects. | Solder the capacitor on the test substrate shown in Fig.3. Cycles : 5 cycles Post-treatment : Let sit for 24+/-2hours at room temperature, then measure. Step Temperature() Time (min) 1 Min.Operating Temp. +0/-3 30+/-3 2 Reference Temp. 2 to 3 3 Max.Operating Temp. +3/-0 30+/-3 4 Reference Temp. 2 to 3 |
| High Temperature High Humidity (Steady) | Appearance: No defects or abnormalities. Capacitance: Within +/-7.5% or +/-0.75pF (Whichever is larger) Q or D.F.: Q100+10C/3 (C:Nominal Capacitance(pF)) I.R.: More than 500M or 25F (Whichever is smaller) | Solder the capacitor on the test substrate shown in Fig.3. Test Temperature : 40+/-2 Test Humidity : 90%RH to 95%RH (Steady) Test Time : 500+/-12h Test Voltage : Rated Voltage Charge/Discharge Current : 50mA max. Post-treatment : Let sit for 24+/-2hours at room temperature, then measure. |
| Durability | Appearance: No defects or abnormalities. Capacitance: Within +/-3% or +/-0.3pF (Whichever is larger) Q or D.F.: Q275+5C/2 (C:Nominal Capacitance(pF)) I.R.: More than 1000M or 50F (Whichever is smaller) | Solder the capacitor on the test substrate shown in Fig.3. Test Temperature : Maximum Operating Temperature+/-3 Test Time : 1000+/-12h Test Voltage : 200% of the rated voltage Charge/Discharge Current : 50mA max. Post-treatment : Let sit for 24+/-2hours at room temperature, then measure. |
Packaging Details
| Minimum Quantity (pcs./reel) | Dimensions of Tape (mm) | Dimensions of Reel (mm) |
| 10000 (W8P2 Code:D) / 20000 (W8P1 Code:W) / 50000 (W8P2 Code:J) | F: 2.0+/-0.05, G: 2.0+/-0.05, H: 1.15(Typ.), C: 4.0+/-0.1, D: 1.75+/-0.1, E: 1.15(Typ.), J: 0.65(Typ.) | 180mm Reel: A: 8.0+/-0.3, B: 3.5+/-0.05, C: 0.5+/-0.05, D: 1.0+/-0.05, E: 0.05 max., w1: 10+/-1.5. 330mm Reel: A: 8.0+/-0.3, B: 3.5+/-0.05, C: 0.5+/-0.05, D: 1.0+/-0.05, E: 0.05 max., w1: 10+/-1.5. |
2410121856_muRata-GRM1555C1H180FA01D_C161534.pdf
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