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Specifications
Voltage Rating:
50V
Capacitance:
1uF
Temperature Coefficient:
X5R
Tolerance:
±10%
Mfr. Part #:
GRM155R61H105KE05D
Package:
0402
Key Attributes
Model Number:
GRM155R61H105KE05D
Product Description
Product Overview
This product specification applies to Chip Multilayer Ceramic Capacitors for general electronic equipment. These capacitors are designed for general-purpose applications and are suitable for use in devices with a typical lifetime of less than 5 years, such as mobile phones, smartphones, and digital cameras. The useful lifetime can be extended under specific operating conditions.
Product Attributes
- Brand: MURATA
- Type: Chip Multilayer Ceramic Capacitors
- Series: GRM15
- Temperature Characteristics: X5R (EIA)
- Packaging: Tape Carrier Packaging
Technical Specifications
| MURATA Part No. | Size Code | Nominal Capacitance | Capacitance Tolerance | Rated Voltage | Temperature Characteristics | Dimensions (mm) (L/W) | Dimensions (mm) (T) | Packaging Code | Packaging Unit |
|---|---|---|---|---|---|---|---|---|---|
| GRM155R61H105KE05_ | 0402 | 1uF | +/-10% | DC 50 V | R6 (X5R) | 0.4 | 0.15 to 0.35 | D | 10000 pcs./Reel (180mm Reel PAPER Tape) |
| GRM155R61H105KE05_ | 0402 | 1uF | +/-10% | DC 50 V | R6 (X5R) | 0.4 | 0.15 to 0.35 | J | 40000 pcs./Reel (330mm Reel PAPER Tape) |
Specifications and Test Methods
| Item | Specification | Test Method (Ref. Standard: JIS C 5101, IEC60384) |
|---|---|---|
| Rated Voltage | Shown in Rated value. | The rated voltage is defined as the maximum voltage which may be applied continuously to the capacitor. |
| Appearance | No defects or abnormalities. | Visual inspection. |
| Dimension | Shown in Rated value. | Using Measuring instrument of dimension. |
| Voltage Proof | No defects or abnormalities. | Measurement Point: Between the terminations; Test Voltage: 250% of the rated voltage; Applied Time: 1s to 5s; Charge/Discharge Current: 50mA max. |
| Insulation Resistance(I.R.) | More than 50F | Measurement Temperature: Room Temperature; Measurement Point: Between the terminations; Measurement Voltage: Rated Voltage; Charging Time: 1min; Charge/Discharge Current: 50mA max. |
| Capacitance | Shown in Rated value. | Measurement Temperature: Room Temperature; Measurement Frequency: 1.0+/-0.1kHz; Measurement Voltage: 1.0+/-0.2Vrms |
| Q or Dissipation Factor (D.F.) | DF: 0.1 max. | Measurement Temperature: Room Temperature; Measurement Frequency: 1.0+/-0.1kHz; Measurement Voltage: 1.0+/-0.2Vrms |
| Capacitance Change (Temperature Characteristics) | Within +/-15% | Measurement Temperature: Room Temperature; Measurement Voltage: Less than 1.0Vrms; Pre-treatment: Heat treatment at 150+0/-10C for 1hour, then 24+/-2hours at room temperature. |
| Adhesive Strength of Termination | No removal of the terminations or other defect should occur. | Solder the capacitor on the test substrate. Applied Force: 5N; Holding Time: 10+/-1s; Applied Direction: In parallel with the test substrate and vertical with the capacitor side. |
| Vibration | Appearance: No defects or abnormalities. Capacitance: Within the specified initial value. Q or D.F.: Within the specified initial value. | Solder the capacitor on the test substrate. Kind of Vibration: Simple harmonic motion 10Hz to 55Hz to 10Hz; Vibration Time: 1min; Total Amplitude: 1.5mm. Applied for 2 hours in each of 3 mutually perpendicular directions (total of 6 hours). |
| Substrate Bending Test | Appearance: No defects or abnormalities. Capacitance: Within +/-10%. | Solder the capacitor on the test substrate. Pressurization Method: Flexure: 1mm; Holding Time: 5+/-1s. |
| Solderability | 95% of the terminations is to be soldered evenly and continuously. | Solder bath method; Flux: Solution of rosin ethanol 25(mass)%; Preheat: 80to 120, 10s to 30s; Solder: Sn-3.0Ag-0.5Cu (Lead Free Solder); Test Temp.: 245+/-5; Test Time: 2+/-0.5s. |
| Resistance to Soldering Heat | Appearance: No defects or abnormalities. Capacitance Change: Within +/-15%. Q or D.F.: Within the specified initial value. I.R.: Within the specified initial value. Voltage Proof: No defects. | Solder bath method; Solder: Sn-3.0Ag-0.5Cu (Lead Free Solder); Solder Temp.: 270+/-5; Test Time: 10+/-0.5s; Preheat Temp.: 120to 150; Preheat Time: 1min. Pre-treatment: Heat treatment at 150+0/-10C for 1hour, then 24+/-2hours at room temperature. Post-treatment: 24+/-2hours at room temperature. |
| Temperature Sudden Change | Appearance: No defects or abnormalities. Capacitance Change: Within +/-7.5%. Q or D.F.: Within the specified initial value. I.R.: Within the specified initial value. Voltage Proof: No defects. | Solder the capacitor on the test substrate. Cycles: 5 cycles. Pre-treatment: Heat treatment at 150+0/-10C for 1hour, then 24+/-2hours at room temperature. Post-treatment: 24+/-2hours at room temperature. |
| High Temperature High Humidity (Steady) | Appearance: No defects or abnormalities. Capacitance Change: Within +/-12.5%. Q or D.F.: DF: 0.2 max. I.R.: More than 500M or 12.5F (Whichever is smaller). | Solder the capacitor on the test substrate. Test Temperature: 40+/-2; Test Humidity: 90%RH to 95%RH (Steady); Test Time: 500+/-12h; Test Voltage: Rated Voltage. Pre-treatment: Heat treatment at 150+0/-10C for 1hour, then 24+/-2hours at room temperature. Post-treatment: Heat treatment at 150+0/-10C for 1hour, then 24+/-2hours at room temperature. |
| Durability | Appearance: No defects or abnormalities. Capacitance Change: Within +/-12.5%. Q or D.F.: DF: 0.2 max. I.R.: More than 1000M or 25F (Whichever is smaller). | Solder the capacitor on the test substrate. Test Temperature: Maximum Operating Temperature+/-3; Test Time: 1000+/-12h; Test Voltage: 100% of the rated voltage. Pre-treatment: Heat treatment at 150+0/-10C for 1hour, then 24+/-2hours at room temperature. Post-treatment: Heat treatment at 150+0/-10C for 1hour, then 24+/-2hours at room temperature. |
2410010232_muRata-GRM155R61H105KE05D_C1518208.pdf
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