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quality Chip multilayer ceramic capacitors rated 35 volts DC muRata GRM033R6YA104KE14D 0201 size for electronic devices factory
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quality Chip multilayer ceramic capacitors rated 35 volts DC muRata GRM033R6YA104KE14D 0201 size for electronic devices factory
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Specifications
Voltage Rating:
35V
Capacitance:
100nF
Temperature Coefficient:
X5R
Tolerance:
±10%
Mfr. Part #:
GRM033R6YA104KE14D
Package:
0201
Key Attributes
Model Number: GRM033R6YA104KE14D
Product Description

Product Overview

Chip Multilayer Ceramic Capacitors for General Electronic Equipment. Designed for general-purpose applications, these capacitors offer reliable performance in a compact 0201 size.

Product Attributes

  • Brand: MURATA
  • Part Number: GRM033R6YA104KE14
  • Packaging Code: D, J, W

Technical Specifications

MURATA Part No.Size CodeTemperature CharacteristicsNominal CapacitanceCapacitance ToleranceRated VoltageDimensions (L x W x T) (mm)Packaging UnitPackaging Code
GRM033R6YA104KE140201X5R(EIA)0.1uF+/-10%DC 35 V0.6 x 0.3 x 0.315000 pcs./ReelD (W8P2)
GRM033R6YA104KE140201X5R(EIA)0.1uF+/-10%DC 35 V0.6 x 0.3 x 0.330000 pcs./ReelW (W8P1)
GRM033R6YA104KE140201X5R(EIA)0.1uF+/-10%DC 35 V0.6 x 0.3 x 0.350000 pcs./ReelJ (W8P2)
ItemSpecificationTest Method
Rated VoltageDC 35 VShown in Rated value.
AppearanceNo defects or abnormalities.Visual inspection.
Dimension0.6 x 0.3 x 0.3 mmUsing Measuring instrument of dimension.
Voltage ProofNo defects or abnormalities. (Test Voltage: 250% of rated voltage, Applied Time: 1s to 5s)Between the terminations
Insulation Resistance(I.R.)More than 50FBetween the terminations (Measurement Voltage: Rated Voltage, Charging Time: 1min)
Capacitance0.1uFRoom Temperature, 1.0+/-0.1kHz, 1.0+/-0.2Vrms
Q or Dissipation Factor (D.F.)DF:0.1 max.Room Temperature, 1.0+/-0.1kHz, 1.0+/-0.2Vrms
Capacitance Change (Temperature Characteristics)Within +/-15% (-55 to +85)Measured after 5 minutes at each specified temperature stage. Pre-treatment: 150C for 1hr, then 24hrs at room temp.
Adhesive Strength of TerminationNo removal of the terminations or other defect should occur.Solder capacitor on test substrate, Applied Force: 2N, Holding Time: 10s
VibrationAppearance: No defects. Capacitance/Q or D.F.: Within specified initial value.Solder capacitor on test substrate. 10Hz to 55Hz to 10Hz, Total Amplitude: 1.5mm, Time: 2 hours in each 3 directions.
Substrate Bending TestAppearance: No defects. Capacitance: Within +/-10%.Solder capacitor on test substrate (0.8mm thickness). Flexure: 1mm, Holding Time: 5s.
Solderability95% of the terminations is to be soldered evenly and continuously.Solder bath method, Sn-3.0Ag-0.5Cu, Test Temp: 245C, Test Time: 2s.
Resistance to Soldering HeatAppearance: No defects. Capacitance: Within +/-15%. Q or D.F./I.R./Voltage Proof: Within specified initial value.Solder bath method, Sn-3.0Ag-0.5Cu, Solder Temp: 270C, Test Time: 10s. Pre-treatment: 150C for 1hr, then 24hrs at room temp.
Temperature Sudden ChangeAppearance: No defects. Capacitance: Within +/-7.5%. Q or D.F./I.R./Voltage Proof: Within specified initial value.5 cycles. Pre-treatment: 150C for 1hr, then 24hrs at room temp. Post-treatment: 24hrs at room temp.
High Temperature High HumidityAppearance: No defects. Capacitance: Within +/-12.5%. Q or D.F.: DF:0.2 max. I.R.: More than 500M or 12.5F (whichever is smaller).Test Temp: 40C, Test Humidity: 90%RH to 95%RH, Test Time: 500h. Pre-treatment: 150C for 1hr, then 24hrs at room temp. Post-treatment: 150C for 1hr, then 24hrs at room temp.
DurabilityAppearance: No defects. Capacitance: Within +/-12.5%. Q or D.F.: DF:0.2 max. I.R.: More than 1000M or 25F (whichever is smaller).Test Temp: Max Operating Temp. Test Time: 1000h. Test Voltage: 100% of rated voltage. Pre-treatment: 150C for 1hr, then 24hrs at room temp. Post-treatment: 150C for 1hr, then 24hrs at room temp.

2410121856_muRata-GRM033R6YA104KE14D_C181043.pdf

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