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Specifications
Voltage Rating:
25V
Capacitance:
100nF
Temperature Coefficient:
X7R
Tolerance:
±10%
Mfr. Part #:
GRM155R71E104KE14D
Package:
0402
Key Attributes
Model Number:
GRM155R71E104KE14D
Product Description
Product Overview
Chip Multilayer Ceramic Capacitors for General Electronic Equipment. Designed for general-purpose applications, these capacitors offer reliable performance and are suitable for a wide range of electronic devices.
Product Attributes
- Brand: MURATA
Technical Specifications
| Part Number | Size Code | Temperature Characteristics | Rated Voltage | Nominal Capacitance | Capacitance Tolerance | Packaging |
| GRM155R71E104KE14 | 0402 | X7R (EIA) | DC 25 V | 0.1uF | +/-10% | 10000 pcs./Reel (W8P2) |
| GRM155R71E104KE14 | 0402 | X7R (EIA) | DC 25 V | 0.1uF | +/-15% | 20000 pcs./Reel (W8P1) |
| GRM155R71E104KE14 | 0402 | X7R (EIA) | DC 25 V | 0.1uF | +/-15% | 50000 pcs./Reel (W8P2) |
| Specification | Test Method | Specification |
| Rated Voltage | Shown in Rated value. | DC 25 V |
| Dimension | Using Measuring instrument of dimension. | 0402 size |
| Voltage Proof | Between the terminations | No defects or abnormalities. (Test Voltage: 250% of rated voltage, Applied Time: 1s to 5s) |
| Insulation Resistance(I.R.) | Between the terminations | More than 50F (Measurement Voltage: Rated Voltage, Charging Time: 1min) |
| Capacitance | Room Temperature, 1.0+/-0.1kHz, 1.0+/-0.2Vrms | 0.1uF |
| Q or Dissipation Factor (D.F.) | Room Temperature, 1.0+/-0.1kHz, 1.0+/-0.2Vrms | DF: 0.1 max. |
| Temperature Characteristics | Room Temperature, Less than 1.0Vrms | Within +/-15% from -55 to 125 (Reference Temp: 25 ) |
| Adhesive Strength of Termination | Solder the capacitor on the test substrate. Applied Force: 5N, Holding Time: 10+/-1s | No removal of the terminations or other defect should occur. |
| Vibration | Solder the capacitor on the test substrate. Simple harmonic motion 10Hz to 55Hz to 10Hz, Total Amplitude: 1.5mm, Vibration Time: 2 hours per direction (3 directions) | Appearance: No defects or abnormalities. Capacitance & Q or D.F.: Within the specified initial value. |
| Substrate Bending Test | Solder the capacitor on the test substrate. Flexure: 1mm, Holding Time: 5+/-1s | Appearance: No defects or abnormalities. Capacitance: Within +/-10%. |
| Solderability | Solder bath method, Sn-3.0Ag-0.5Cu, 245+/-5, 2+/-0.5s | 95% of the terminations is to be soldered evenly and continuously. |
| Resistance to Soldering Heat | Solder bath method, Sn-3.0Ag-0.5Cu, 270+/-5, 10+/-0.5s | Capacitance: Within +/-7.5%. Q or D.F. & I.R.: Within the specified initial value. |
| Temperature Sudden Change | Solder the capacitor on the test substrate. 5 cycles (-55 to +125) | Capacitance: Within +/-7.5%. Q or D.F. & I.R.: Within the specified initial value. |
| High Temperature High Humidity (Steady) | Solder the capacitor on the test substrate. Test Temperature: 40+/-2, Test Humidity: 90%RH to 95%RH, Test Time: 500+/-12h, Test Voltage: Rated Voltage | Capacitance: Within +/-12.5%. Q or D.F.: DF: 0.2 max. I.R.: More than 500M or 12.5F (Whichever is smaller). |
| Durability | Solder the capacitor on the test substrate. Test Temperature: Maximum Operating Temperature+/-3, Test Time: 1000+/-12h, Test Voltage: 150% of the rated voltage | Capacitance: Within +/-12.5%. Q or D.F.: DF: 0.2 max. I.R.: More than 1000M or 25F (Whichever is smaller). |
2410121858_muRata-GRM155R71E104KE14D_C77014.pdf
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