Product Overview
Chip Multilayer Ceramic Capacitors designed for consumer electronics and industrial equipment. These capacitors are suitable for a wide range of applications, excluding those directly related to human life safety or critical property protection. They are also specified for automotive infotainment/comfort equipment and mobile devices with a typical lifetime of less than 5 years.
Product Attributes
- Brand: MURATA
Technical Specifications
| Part Number | Series | Dimension (L x W) | Dimension (T) | Temperature Characteristics | Rated Voltage | Capacitance | Capacitance Tolerance | Operating Temp. Range | Package | Packing Quantity |
|---|---|---|---|---|---|---|---|---|---|---|
| GRM21BZ71E106KE15-01A | GRM | 2.0+/-0.2 x 1.25+/-0.2 mm | 1.25+/-0.2 mm | [Z7] (X7R(MURATA)) | DC 25V | 10F | +/-10% | -55 to 125 | K (330mm Reel Plastic Tape W8P4) | 10000 pcs./Reel |
| GRM21BZ71E106KE15-01A | GRM | 2.0+/-0.2 x 1.25+/-0.2 mm | 1.25+/-0.2 mm | [Z7] (X7R(MURATA)) | DC 25V | 10F | +/-10% | -55 to 125 | L (180mm Reel Plastic Tape W8P4) | 3000 pcs./Reel |
| Item | Specification | Test Method (Ref. Standard) |
|---|---|---|
| Capacitance Temperature Characteristics | -15 to 15 % at 25 (Ref.Temp.) | JIS C 5101, IEC60384 |
| Q or Dissipation Factor (D.F.) | DF0.1 | JIS C 5101, IEC60384 |
| Insulation Resistance(I.R.) | More than 50F | JIS C 5101, IEC60384 |
| Voltage proof | No defects or abnormalities. (Test Voltage 250% of rated voltage, Applied Time 1s to 5s) | JIS C 5101, IEC60384 |
| Appearance | No defects or abnormalities. | Visual inspection |
| Dimension | Shown in Dimension. | Using Measuring instrument of dimension. |
| Rated Voltage | Maximum voltage which may be applied continuously. | JIS C 5101, IEC60384 |
| Temperature Sudden Change | Appearance: No defects or abnormalities. Capacitance Change: Within +/-7.5% | JIS C 5101, IEC60384 |
| Temperature Cycling | Appearance: No defects or abnormalities. Capacitance Change: Within +/-15% | JIS C 5101, IEC60384 |
| Resistance to Soldering Heat | Appearance: No defects or abnormalities. Capacitance Change: Within +/-15% | Solder bath method (Sn-3.0Ag-0.5Cu) |
| Solderability | 95% of the terminations is to be soldered evenly and continuously. | Solder bath method (Sn-3.0Ag-0.5Cu) |
| Substrate Bending test | Appearance: No defects or abnormalities. Capacitance Change: Within +/-10% | JIS C 6484 |
| Vibration | Appearance: No defects or abnormalities. Capacitance: Within the specified initial value. Q or D.F.: Within the specified initial value. | JIS C 5101, IEC60384 |
| Adhesive Strength of Termination | No removal of the terminations. | JIS C 5101, IEC60384 |
| Durability | Appearance: No defects or abnormalities. Capacitance Change: Within +/-12.5%. Q or D.F.: DF0.2. I.R.: More than 25F | JIS C 5101, IEC60384 |
| High Temperature High Humidity (Steady) | Appearance: No defects or abnormalities. Capacitance Change: Within +/-12.5%. Q or D.F.: DF0.2. I.R.: More than 12.5F | JIS C 5101, IEC60384 |
2507241157_muRata-GRM21BZ71E106KE15L_C237493.pdf
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