Product Overview
This product specification applies to multi-layer chip ceramic capacitors (MLCCs). These capacitors offer reliable performance and are designed for various electronic applications. Careful adherence to usage and handling guidelines is recommended to ensure optimal performance and prevent potential damage.
Product Attributes
- Brand: Not specified
- Origin: Not specified
- Material: Dielectric ceramic, Nickel inner electrode, Copper outer electrode, Tin plating
- Color: Not specified
- Certifications: Not specified
Technical Specifications
| Part Number | Size (mm) | Capacitance | Capacitance Tolerance | Rated Voltage | Temperature Characteristic | Temperature Range | Capacitance Change Rate | Thickness (mm) | Packaging | Packaging Quantity |
| CGA0805X7R225M500MT | 0805 (2.000.20 x 1.250.20) | 2.2uF | 20% | 50Vdc | X7R | -55 to +125 | 15% | 0.2-0. | 180mm Reel Tape | 2,000 |
| Test Item | Specification | Test Method (Ref. Standard: JIS C 5101, IEC60384) |
| Capacitance | Within specified tolerance. | Test Voltage: 1.00.2Vrms (Frequency: 1.00.1MHz for C10uF, 1.00.1KHz for C>10uF); Measurement Temperature: 25. |
| Insulation Resistance (I.R.) | 10 G or RC 500F (whichever is smaller) | Test Voltage: RV50V: 300% RV; 50VRV250V: 200% RV; 250VRV630V: 150% RV; 630VRV1000V: 130% RV. Test Time: 1 to 5 seconds. |
| Voltage Proof | Withstand test voltage without defects or abnormalities. | Test Voltage: RV50V: 250% RV; 50VRV250V: 200% RV; 250VRV500V: 150% RV; 500VRV1000V: 130% RV. Test Time: 1 to 5 seconds. |
| Quality Factor / Dissipation Factor (Q or D.F.) | C0G: 10 G or RC 500F (whichever is smaller); X7R/X5R/X6S: 100.0 Mohm | Frequency: 1.00.1MHz (C0G), 1.00.1KHz (X7R/X5R/X6S), 120Hz24Hz. |
| Appearance | No defects or abnormalities. Visual (microscope) inspection. | N/A |
| Dimension | Conforms to specifications. Micrometer inspection of physical dimensions. | N/A |
| Temperature Characteristics of Capacitance | C0G: 15%; X7R/X5R: 10%; X6S: 22% | Measurement Temperature: -30 to +85 (X7R/X5R/X6S), -55 to +125 (C0G). Reference Temperature: 252. Capacitance change measured after 5 minutes at each temperature stage. |
| Substrate Bending Test | No terminal peeling, ceramic breakage, etc. | Apply gradual force to the center of the specimen in the horizontal direction of the P.C. board. Force: 5N (0402: 2.5N / 0201: 1N). Bending: 1mm. |
| Adhesive Strength of Termination | No terminal peeling, ceramic breakage, etc. | N/A |
| Solderability | 95% of the terminals should be uniformly and continuously soldered. | Flux: Isopropyl alcohol Rosin 25% solid solution. Solder Temperature: 2455C. Dwell Time: 20.5s. Solder Type: Sn-3.0Ag-0.5Cu (Lead Free Solder). |
| Resistance to Soldering Heat | No cracks in appearance. | Solder Bath Method. Solder: Sn-3.0Ag-0.5Cu (Lead Free Solder). Test Temperature: 2605C. Solder Location: Until both ends are completely wetted. |
| Temperature Cycle | Appearance: No defects or abnormalities. Capacitance Change: X7R/X5R: 15%; C0G: 7.5%. Insulation Resistance: Same as initial value. Q/DF: Same as initial value. | 5 cycles. Temperature Steps: -55 to +125. Time per step: 303min. Room Temperature transition: 2~5min. Pre-treatment: Heat treatment at 150+0/-10C for 1 hour, then static at room temperature for 242 hours. Post-treatment: Static at room temperature for 242 hours. |
| Life Test | Appearance: No defects or abnormalities. Capacitance: X7R/X5R: 12.5%; C0G: 2.5% or 0.25pF (whichever is larger). Insulation Resistance: X7R: 1G or R.C10s; X5R: 1G or R.C50s (whichever is smaller). Q/DF: C0G: 275+5/2*C min; X7R/X5R/X6S: 16V: 7% or 2x initial value; 25V: 5% or 2x initial value (whichever is larger). | Test Voltage: 100% R.V. Test Time: 100012 hours. Test Temperature: Max operating temperature 3. Pre-treatment: Heat treatment at 150+0/-10C for 1 hour, then static at room temperature for 242 hours. Post-treatment: Static at room temperature for 242 hours. Voltage conditioning: 1 hour at test temperature and voltage, then static at ambient conditions for 242 hours before measurement. |
| High Temperature High Humidity Test | Appearance: No defects or abnormalities. Capacitance: X7R/X5R: 15%; C0G: 7.5%. Insulation Resistance: Same as initial value. Q/DF: C0G: 275+5/2*C min; X7R/X5R/X6S: 16V: 7% or 2x initial value; 25V: 5% or 2x initial value (whichever is larger). | Test Time: 50024 hours. Test Voltage: Rated voltage (not exceeding 630V). Test Temperature: 402. Test Humidity: 90%RH to 95%RH. Pre-treatment: Heat treatment at 150+0/-10C for 1 hour, then static at room temperature for 242 hours. Post-treatment: Static at room temperature for 242 hours. Voltage conditioning: 1 hour at test temperature and voltage, then static at ambient conditions for 242 hours before measurement. |
| Size (mm) | Tape Width (mm) | Reel Diameter (mm) | Quantity/Reel | Packaging Material |
| 01005 (0.40 x 0.20) | 8 | 180 (7") | 10,000 | Paper Tape |
| 0201 (0.60 x 0.30) | 8 | 180 (7") | 15,000 | Paper Tape |
| 0402 (1.00 x 0.50) | 8 | 180 (7") | 10,000 | Paper Tape |
| 0603 (1.60 x 0.80) | 8 | 180 (7") | 4,000 | Paper Tape |
| 0805 (2.00 x 1.25) | 8 | 180 (7") | 2,000 | Paper Tape / Plastic Tape |
| 1206 (3.20 x 1.60) | 8 | 180 (7") | 1,000 | Paper Tape / Plastic Tape |
| 1210 (3.20 x 2.50) | 8 | 180 (7") | 1,000 | Plastic Tape |
2407021626_HRE-CGA0805X7R225M500MT_C23692980.pdf
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