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quality Chip ceramic capacitor multilayer 1206 size 100nF capacitance 50 volts rated voltage HRE CGA1206X7R104K500KT factory
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quality Chip ceramic capacitor multilayer 1206 size 100nF capacitance 50 volts rated voltage HRE CGA1206X7R104K500KT factory
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Specifications
Voltage Rating:
50V
Capacitance:
100nF
Temperature Coefficient:
X7R
Tolerance:
±10%
Mfr. Part #:
CGA1206X7R104K500KT
Package:
1206
Key Attributes
Model Number: CGA1206X7R104K500KT
Product Description

Product Overview

The CGA1206X7R104K500KT is a multilayer chip ceramic capacitor designed for various electronic applications. It offers stable performance across a wide temperature range with specific capacitance and voltage ratings.

Product Attributes

  • Brand: CGA
  • Material: Dielectric Ceramic, Nickel (internal electrode), Copper (external electrode), Tin (plating)

Technical Specifications

ModelSize (mm)Temperature CharacteristicCapacitanceCapacitance ToleranceRated VoltageThickness (mm)Packaging
CGA1206X7R104K500KT1206 (3.2*1.6)X7R100nF10%50Vdc0.85+0.10/-0.104,000 pcs (180mm Reel)

Specifications and Test Methods

Test ItemTest SpecificationTest Method (Reference Standard: JIS C 5101, IEC60384)
AppearanceNo defects or abnormalities.Visual (microscope) inspection.
DimensionConforms to specifications.Micrometer inspection of physical dimensions.
Voltage ProofWithstand test voltage, no defects or abnormalities.See table for test voltages based on material and rated voltage. Test time: 1-5s.
Insulation Resistance (I.R.)C0G: 10 G or RC 500F (whichever is smaller); X7R/X5R/X6S: 100.0 MohmTest temperature: 25. Test points: between terminals. Test voltage: IF500V: Rated Voltage; IF500V: 500V. Charging time: 1 minute.
CapacitanceWithin specified tolerance.Measurement temperature: 25. See table for capacitance, frequency, and voltage based on material.
Q Factor / Dissipation Factor (D.F.)C0G: 1.00.1 MHz (C1000pF), 1.00.1 KHz (C>1000pF); X7R/X5R/X6S: 10.0% (C>10uF), 1.00.1 KHz (C10uF)See table for measurement frequency and voltage based on material.
Temperature Characteristics of CapacitanceC0G: 30ppm/; X5R: 15%; X6S: 22%; X7R: 15%Measure capacitance change at specified temperature stages after thermal equilibrium. Steps: Reference temp (252), Min operating temp (3), Reference temp (252), Max operating temp (2), Reference temp (252).
Adhesive Strength of TerminationNo termination detachment, ceramic breakage.Weld capacitor to test substrate. Force: 5N (0402:2.5N / 0201:1N). Duration: 101s. Application direction: gradual force applied horizontally to the PC board at the center of the specimen.
Substrate Bending TestAppearance: No defects or abnormalities. C/C: X7R/X5R: 10%; X7R/X5R: 12.5%; C0G: 1% or 0.5 pF (whichever is greater).Weld capacitor on PC board and bend 1mm.
Solderability95% of terminations should be uniformly and continuously soldered.Solder: Sn-3.0Ag-0.5Cu (lead-free). Flux: Isopropyl alcohol Rosin 25% solid solution. Solder temperature: 2455 C. Dwell time: 20.5s. Solder position: until both ends are completely wetted.
Resistance to Soldering HeatAppearance: No cracks. Capacitance change: C0G: within 2.5% or 0.25pF (whichever is greater); X7R/X5R/X6S: 7.5%. Q Factor / Dissipation Factor: Same as initial value. Insulation Resistance: Same as initial value. Voltage Proof: No defects or abnormalities.Pre-treatment: Heat at 150+0/-10 C for 1 hour, then stand at room temp for 242 hours. Solder bath method. Solder type: Sn-3.0Ag-0.5Cu. Test temp: 2605. Test time: 101s. Preheating temp: 110 to 140. Preheating time: 1 minute. Post-treatment: Stand at room temp for 242 hours.
Temperature CycleAppearance: No defects or abnormalities. Capacitance change: COG; X7R/X5R:15%; X7R/X5R/X6S. Q Factor / Dissipation Factor: Same as initial value. Insulation Resistance: Same as initial value.Pre-treatment: Heat at 150+0/-10 C for 1 hour, then stand at room temp for 242 hours. Temperature cycle: 5 cycles. Steps: Min temp (3) 303min, Room temp 2~5min, Max temp (3) 303min, Room temp 2~5min. Post-treatment: Stand at room temp for 242 hours.
High Temperature High Humidity (Load)Appearance: No defects or abnormalities. Capacitance change: X7R/X5R:12.5%. Q Factor / Dissipation Factor: (COG) C30pF 350min, 10pFC30pF 275+5/2*C min, 10pF 200+10*C min; (X7R/X5R/X6S) 16V: 7% or 2x initial value; 25V: 5% or 2x initial value (whichever is greater). Insulation Resistance: 500M or R.C 5s (whichever is smaller).Pre-treatment: Heat at 150+0/-10C for 1 hour, then stand at room temp for 242 hours. Test temp: 402. Test humidity: 90% RH to 95% RH. Test time: 50024 hours. Test voltage: Rated voltage (not exceeding 630V). Voltage conditioning: 1 hour at test temp and voltage, then 242 hours at ambient conditions.
Life TestAppearance: No defects or abnormalities. Capacitance change: X7R/X5R:15%. Q Factor / Dissipation Factor: (C0G) C30pF 350min, 10pFC30pF 275+5/2*C min, 10pF 200+10*C min; (X7R/X5R/X6S) 16V: 7% or 2x initial value; 25V: 5% or 2x initial value (whichever is greater). Insulation Resistance: X7R: 1G or R.C10s; X5R: 1G or R.C 50s (whichever is smaller).Pre-treatment: Heat at 150+0/-10 C for 1 hour, then stand at room temp for 242 hours. Test temp: Max operating temp 3. Test time: 100012 hours. Test voltage (life): 100% R.V. Voltage conditioning: 1 hour at test temp and voltage, then 242 hours at ambient conditions.

Packaging Specifications

Size CodeSize (mm)Tape SpecificationQuantity per ReelMaterial
010050.40*0.20Paper Tape20,000Paper
02010.60*0.30Paper Tape15,000Paper
04021.00*0.50Paper Tape10,000Paper
06031.60*0.80Paper Tape4,000Paper
08052.00*1.25Paper Tape4,000Paper
08052.00*1.25Plastic Tape2,000Plastic
12063.20*1.60Paper Tape4,000Paper
12063.20*1.60Plastic Tape2,000Plastic
12063.20*1.60Plastic Tape2,000Plastic
12103.20*2.50Plastic Tape3,000Plastic
12103.20*2.50Plastic Tape2,000Plastic
12103.20*2.50Plastic Tape1,000Plastic
12103.20*2.50Plastic Tape1,000Plastic

Application Restrictions

Contact manufacturer for applications requiring high reliability, especially those that could directly cause damage to third-party life, body, or property. Examples include: aircraft equipment, aerospace equipment, submarine equipment, power plant control equipment, medical equipment, transportation equipment, traffic signal equipment, disaster prevention/crime prevention equipment, data processing equipment, and similar applications with high complexity and/or reliability requirements.

Transportation and Storage Methods

Transportation: Packaged products are suitable for modern transportation. Protect from rain and corrosive substances. Avoid heavy dropping and forceful compression.

Storage: Shelf life for good solderability is one year from the date of manufacture. Do not open tape reels before use. Once opened, products should be used within three months. Storage temperature: 0 ~35. Storage relative humidity: <70%.

Usage Precautions

Multilayer chip ceramic capacitors (MLCCs) may experience short circuits, open circuits, smoke, fire, or explosion under harsh operating environments exceeding specified frequencies, or under external mechanical overpressure. Always adhere to the specifications in this document. Contact the technical, quality control, or production department for clarification.

Soldering Recommendations

Solder Amount: A. Excessive solder can damage the capacitor due to excessive terminal pressure. B. Insufficient solder may lead to poor contact between the capacitor chip and the circuit.

Recommended Solder Amount: See document for details on reflow soldering, wave soldering, and soldering iron rework.

Recommended Soldering Temperature Curve: See document for details on reflow soldering and wave soldering.


2410300953_HRE-CGA1206X7R104K500KT_C42371678.pdf

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