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Specifications
Voltage Rating:
16V
Capacitance:
100nF
Temperature Coefficient:
X7R
Tolerance:
±10%
Mfr. Part #:
CGA0201X7R104K160ET
Package:
0201
Key Attributes
Model Number:
CGA0201X7R104K160ET
Product Description
Product Overview
This specification applies to multilayer ceramic chip capacitors (MLCCs). These capacitors are designed for various electronic applications requiring stable capacitance and reliable performance.
Product Attributes
- Brand: CGA
- Material: Ceramic dielectric (X7R), Nickel inner electrode, Copper outer electrode, Tin plating
Technical Specifications
| Model | Size (mm) | Capacitance | Capacitance Tolerance | Rated Voltage | Temperature Characteristic | Thickness (mm) | Packaging |
|---|---|---|---|---|---|---|---|
| CGA0201X7R104K160ET | 0.60+0.10/-0.03 (L) x 0.30+0.10/-0.03 (W) | 100nF | 10% | 16Vdc | X7R (-55 to +125, 15% capacitance change) | 0.10-0.25 | 180mm Reel, 15,000 pcs |
| Test Item | Test Specification | Test Method (Reference Standard: JIS C 5101, IEC60384) |
|---|---|---|
| Capacitance | Within specified tolerance. | Measurement conditions vary by capacitance value and voltage. |
| Insulation Resistance (I.R.) | 10 G or RC 500F (whichever is smaller) for C10uF; 100.0 Mohm for C>10uF | Measured at 25 after 1 minute charge time. |
| Voltage Proof | Withstand test voltage without defects or abnormalities. | Test voltage is a percentage of Rated Voltage (RV) depending on RV value. Test time 1 to 5 seconds. |
| Quality Factor / Dissipation Factor (Q or D.F.) | C0G: 10 G or RC 500F (whichever is smaller); X7R/X5R/X6S: 10.0% | Measured at specified frequencies (1.00.1MHz, 1.00.1KHz, 120Hz24Hz) and voltage. |
| Appearance | No defects or abnormalities. Visual (microscope) inspection. | Visual (microscope) inspection. |
| Dimension | Conforms to specifications. | Checked using a micrometer for physical dimensions. |
| Temperature Characteristics of Capacitance (C/C) | C0G: 1% or 0.5 pF (whichever is greater); X7R/X5R: 10% or 12.5% (high capacitance series); X6S: 22% | Measured at various temperature steps (-55 to +125) relative to 25. |
| Substrate Bending test | No terminal detachment, ceramic breakage, etc. | Force applied gradually in the horizontal direction at the center of the specimen. Force varies by size (e.g., 1N for 0201). |
| Adhesive Strength of Termination | No defects or abnormalities. | Capacitor soldered on PC board and bent 1mm. |
| Test Item | Test Specification | Test Method |
|---|---|---|
| Solderability | 95% of terminals should be uniformly and continuously soldered. | Solder bath method. Solder: Sn-3.0Ag-0.5Cu (Lead Free). Solder temperature: 2455C, dwell time: 20.5s. |
| Resistance to Soldering Heat | No cracks in appearance. | Solder bath method. Solder: Sn-3.0Ag-0.5Cu (Lead Free). Peak temperature 2605C. |
| Temperature Cycle | Capacitance change within 15% for X7R/X5R; 7.5% for C0G. Insulation resistance and Q factor/Dissipation factor as per initial values. Appearance: No defects or abnormalities. | 5 cycles of temperature steps from -55 to +125. |
| Life Test | Capacitance change within 12.5% for X7R/X5R; 15% for X7R. Insulation resistance 1G or R.C10s (X7R), 1G or R.C50s (X5R). Q factor/Dissipation factor as per initial values. Appearance: No defects or abnormalities. | Test voltage 100% R.V. for 100012 hours at max operating temperature. |
| High Temperature High Humidity (Load) | Capacitance change within 7% or 2x initial value (16V), 5% or 2x initial value (25V) for X7R/X5R/X6S. Insulation resistance and Q factor/Dissipation factor as per initial values. Appearance: No defects or abnormalities. | Test voltage 100% R.V. for 50024 hours at 402 and 90%-95% RH. |
2405231405_HRE-CGA0201X7R104K160ET_C22435929.pdf
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