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Quality 40 MHz Quartz Crystal Frequency Control Component HELE X2C040000B91HA-Z Suitable for SMT Assembly factory
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Quality 40 MHz Quartz Crystal Frequency Control Component HELE X2C040000B91HA-Z Suitable for SMT Assembly factory
>
Specifications
Normal temperature Frequency Tolerance:
±10ppm
Frequency Stability:
±10ppm
Load Capacitance:
9pF
Operating Temperature:
-30℃~+85℃
Frequency:
40MHz
Mfr. Part #:
X2C040000B91HA-Z
Package:
SMD2016-4P
Key Attributes
Model Number: X2C040000B91HA-Z
Product Description

Product Overview

The HSX211S Quartz Crystal from Harmony Electronics Corporation is a high-quality frequency control component designed for various electronic applications. This Pb-free, RoHS, HF-Halogen, and REACH compliant product offers reliable performance with a nominal frequency of 40.000000MHz. Manufactured in Taiwan, it is suitable for automated SMT processes and designed to meet stringent environmental and mechanical performance standards.

Product Attributes

  • Brand: HARMONY ELECTRONICS CORPORATION
  • Product Type: Quartz Crystal
  • Model: HSX211S
  • Country of Origin: Taiwan
  • Certifications: Pb free, RoHS Compliant, HF-Halogen free, REACH Compliant
  • MSL Level: 1

Technical Specifications

Specification Value Unit Notes
Nominal Frequency 40.000000 MHz
Mode of Oscillation Fundamental
Frequency Tolerance 10 ppm at 253
Equivalent Resistance (RR) 80 SERIES
Storage Temperature Range -40 to +85
Operable Temperature Range -30 to +85
Temperature Stability 10 ppm -30~ +85
Loading Capacitance (CL) 9.0 pF
Drive Level (DL) 10 to 100 W
Shunt Capacitance (C0) 2.0 pF
Insulation Resistance 500 M at DC 100V
Aging 3 ppm/Year
Circuit Measurement Measured in HP/E5100A, S&A 250B
Dimensions (L x W) 1.6 x 1.2 mm (Refer to Dimension Diagram)
Pin Connections #1 Crystal, #2 Crystal, #3 GND/Lid, #4 GND/Lid
Carrier Tape Width 8.0 mm 0.2
Reel Quantity 3000 PCS/REEL Standard Packing Quantity
Shock Test Dropping from 120 cm height 3 times on 30 mm Concrete floor. Refer to: JIS C 60068232 A
Vibration Test Frequency 1055Hz, Sine Wave full amplitude of 0.8mm to X, Y and Z 3 axes, 2 cycles and duration of 2 hours to each direction. Refer to: JIS C 6006826 A
Leakage Test 1.0x109 Pam/sec. Max. Measured by Helium leak detector.
Solder Ability Test Dipping in solder bath at 245deg.C 5deg.C for 3 0.5 sec. Refer to: JIS C 60068220 B
Bending Strength Test Board bent to 3 mm and hold for 5 1 sec. Pressure speed: 0.5 mm/sec. Refer to: EIAJ ET7403 A
Adhesion Test Pressure: 5N for 101 sec. Refer to: EIAJ ET7403 C
Body Strength Test Pressure: 5N for 101sec Refer to: EIAJ ET7403 C
Resistance of Soldering Heat Specification A FREQ. DRIFT: 5 ppm Max, RESISTANCE DRIFT: 15% or 2
Humidity Test 602, RH 90~95%, duration of 240 hours. Refer to: JIS C 6006823 A
Storage in Low Temperature -40deg.C 2deg.C, duration of 240 hours. Refer to: JIS C 6006821 A
Storage in High Temperature +85deg.C 2deg.C, duration of 240 hours. Refer to: JIS C 6006822 A
Temperature Cycles -40deg.C 2deg.C (30min) +85deg.C 2deg.C (30min) 25 cycles. Refer to: JIS C 0025 A

2410121447_HELE-X2C040000B91HA-Z_C254305.pdf

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