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Quality Precision 25 Megahertz Quartz Crystal Oscillator HELE X3S025000FC1H-HV for Electronic Applications factory
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Quality Precision 25 Megahertz Quartz Crystal Oscillator HELE X3S025000FC1H-HV for Electronic Applications factory
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Specifications
Normal temperature Frequency Tolerance:
±30ppm
Frequency Stability:
±30ppm
Operating Temperature:
-40℃~+85℃
Load Capacitance:
12pF
Frequency:
25MHz
Mfr. Part #:
X3S025000FC1H-HV
Package:
SMD3225-4P
Key Attributes
Model Number: X3S025000FC1H-HV
Product Description

Product Overview

The Harmony Electronics Corporation HSX321S Quartz Crystal is a high-performance electronic component designed for precise frequency generation. It operates at a nominal frequency of 25.000000MHz and is suitable for a wide range of electronic applications. This crystal is manufactured with Pb-free, RoHS Compliant, HF-Halogen free, and REACH Compliant materials, ensuring environmental responsibility and safety. Its robust design and stable performance make it ideal for integration into various electronic devices.

Product Attributes

  • Brand: H.ELE. (Harmony Electronics Corporation)
  • Product Type: Quartz Crystal
  • Model: HSX321S
  • Country of Origin: Taiwan
  • Certifications: Pb free, RoHS Compliant, HF-Halogen free, REACH Compliant
  • MSL Level: 01

Technical Specifications

Item Electrical Spec. Unit Notes Min Type Max
Frequency (FL) Frequency MHz 25.000000
Mode of oscillation Fundamental
Frequency tolerance ppm at 253 -30 +30
Equivalent resistance (RR) Equivalent resistance SERIES 30
Storage temperature range -40 +85
Operable temperature range -40 +85
Temperature stability ppm -40 ~ +85 -30 +30
Loading capacitance (CL) Loading capacitance pF 12.0
Drive level (DL) Drive level W 10 100
Shunt Capacitance (C0) Shunt Capacitance pF 2.0
Insulation resistance Insulation resistance M at DC 100V 500
Aging Aging ppm/Year -3 +3
Circuit Measured in HP/E5100A,S&A 250B
Dimensions (Unit: mm, Tolerance: 0.1)
Dimension 1 Length mm 3.2 0.1
Dimension 2 Width mm 2.5 0.1
Dimension 3 Height mm 0.7 0.1
Dimension 4 Length mm 1.2
Dimension 5 Width mm 0.9
Dimension 6 Width mm 0.8
Dimension 7 Width mm 0.7
Inside Structure
Component Material Note
Base Ceramic Al2O3
Lid Metal Fe- Ni Co Ni Plating
Kovar Metal Fe- Ni -Co
Crystal Blank Quartz SiO2 Rectangular At-Cut
Electrode Metal
PAD Metal W Ni Plating Au Plating
Connective Adhesive Silver Powder Ag
Reflow Conditions
Stage Temperature Time
Preheat 160~180 deg.C 120 sec.
Primary heat >=220 deg.C 60~120 sec.
Peak 260 deg.C 10 sec. Max.
Emboss Carrier Tape & Reel
Carrier Tape Material
Carrier tape PS Conductive
Top tape PET
Standard Packing Quantity 3,000PCS / REEL
Mechanical Performance
Item Test Methods Specifications Code
Shock Dropping from 120 cm height 3 times on 30 mm Concrete floor. JIS C 60068-2-32 A
Vibration Frequency 10-55Hz, Sine Wave full amplitude of 0.8mm to X, Y and Z 3 axes, 2 cycles and duration of 2 hours to each direction. JIS C 60068-2-6 A
Leakage Test Measured by Helium leak detector. Leak Rate 1.0x10-9 Pa-m3/sec. Max. ---
Solder ability After applying ROSIN Flux, dipping in solder bath at 245deg.C 5deg.C for 3 0.5 sec. More than 90% of lead shall be covered by new solder. JIS C 60068-2-20 B
Bending Strength Mount a sample on board. Apply Pressure to the center of board until it is bent to 3 mm and hold for 5 1 sec. Pressure speed: 0.5 mm/sec. EIAJ ET-7403 A
Adhesion Mount a sample on the circuit board. Apply pressure vertically to the side of specimen attached to the circuit board with the pressure jig. Pressure: 5N for 101 sec. EIAJ ET-7403 C
Body strength Apply pressure to the center of body with the R0.5 pressure jig. pressure :10N for 101sec EIAJ ET-7403 C
Environmental Performance
Item Test Methods Specifications Code
Resistance of Soldering Heat Performing as the following reflow: A
Humidity Temperature 602, RH 90~95%, duration of 240 hours. Back to room temperature first, then check the component after 1~2 hours. FREQ. DRIFT: 5 ppm Max, RESISTANCE DRIFT: 15% or 2 JIS C 60068-2-3 A
Storage in Low Temperature -40deg.C 2deg.C, duration of 240 hours. Back to the room temperature first, then check the component after 1~2 hours. JIS C 60068-2-1 A
Storage in High Temperature +85deg.C 2deg.C, duration of 240 hours. Back to the room temperature first, then check the component after 1~2 hours. JIS C 60068-2-2 A
Temperature cycles -40deg.C 2deg.C (30min) +85deg.C 2deg.C (30min) 25 cycles. And Temperature Increasing/reducing time3mins. Back to the room temperature first, then check the component after 1~2 hours. FREQ. DRIFT: 15 ppm Max, RESISTANCE DRIFT: 25% or 10 JIS C 0025 A

2410121447_HELE-X3S025000FC1H-HV_C254349.pdf

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