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Quality Quartz Crystal Unit HELE X3S024000BK1H-Z 24 MHz Frequency with Fundamental Oscillation Mode and RoHS factory
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Quality Quartz Crystal Unit HELE X3S024000BK1H-Z 24 MHz Frequency with Fundamental Oscillation Mode and RoHS factory
>
Specifications
Normal temperature Frequency Tolerance:
±10ppm
Frequency Stability:
±10ppm
Load Capacitance:
20pF
Operating Temperature:
-30℃~+85℃
Frequency:
24MHz
Mfr. Part #:
X3S024000BK1H-Z
Package:
SMD3225-4P
Key Attributes
Model Number: X3S024000BK1H-Z
Product Description

Product Overview

The Harmony Electronics HSX321S is a Quartz Crystal Unit designed for reliable frequency generation. This component is Pb-free, RoHS Compliant, HF-Halogen free, and REACH Compliant, ensuring adherence to environmental standards. It is manufactured in Taiwan, with production facilities also located in Thailand and China.

Product Attributes

  • Brand: Harmony Electronics Corporation
  • Product Type: Quartz Crystal
  • Model: HSX321S
  • Country of Origin: Taiwan
  • Certifications: Pb free, RoHS Compliant, HF-Halogen free, REACH Compliant
  • MSL Level: 01

Technical Specifications

Item Electrical Spec. Unit Notes
Nominal Frequency 24.000000 MHz
Frequency (FL) 24.000000 MHz
Mode of oscillation Fundamental
Frequency tolerance -10 to +10 ppm at 253
Equivalent resistance (RR) 60 SERIES
Storage temperature range -40 to +85
Operable temperature range -30 to +85
Temperature stability -10 to +10 ppm -30 ~ +85
Loading capacitance (CL) 20.0 pF
Drive level (DL) 10 to 100 W
Shunt Capacitance (C0) 2.0 pF
Insulation resistance 500 M at DC 100V
Aging -3 to +3 ppm/Year
Circuit Measured in HP/E5100A,S&A 250B
Dimensions (L x W x H) 3.20.1 x 2.50.1 x 0.70.1 mm
Carrier Tape Width 8.00.2 mm
Reel Diameter 180+0/-3 mm
Standard Packing Quantity 3,000 PCS / REEL
Shock Test Dropping from 120 cm height 3 times on 30 mm Concrete floor. Refer to: JIS C 60068-2-6 A
Vibration Test Frequency 10-55Hz, Sine Wave full amplitude of 0.8mm to X, Y and Z 3 axes, 2 cycles and duration of 2 hours to each direction. Refer to: MIL-HDBK-781A 6.5.2/ JIS C 60068-2-6 A
Leakage Test Leak Rate 1.0x10-9 Pa-m3/sec. Max. Measured by Helium leak detector.
Solder ability Dipping in solder bath at 245deg.C 5deg.C for 3 0.5 sec. Refer to: JIS C 60068-2-20 B
Bending Strength Apply Pressure to the center of board until it is bent to 3 mm and hold for 5 1 sec. Refer to: EIAJ ET-7403 A
Adhesion Apply pressure vertically to the side of specimen attached to the circuit board with the pressure jig. Pressure: 5N for 101 sec. Refer to: EIAJ ET-7403 A
Body strength Apply pressure to the center of body with the R0.5 pressure jig. pressure :10N for 101sec Refer to: EIAJ ET-7403 A
Humidity Test Temperature 602, RH 90~95%, duration of 240 hours. Refer to: JIS C 60068-2-3 A
Storage in Low Temperature -40deg.C 2deg.C, duration of 240 hours. Refer to: JIS C 60068-2-1 A
Storage in High Temperature +85deg.C 2deg.C, duration of 240 hours. Refer to: JIS C 60068-2-2 A
Temperature cycles -40deg.C 2deg.C (30min) +85deg.C 2deg.C (30min) 25 cycles. Refer to: JIS C 0025 A
Frequency variation (after environmental tests) 5 ppm
Equivalent resistance (after environmental tests) 15% or 2
Solder coverage (after environmental tests) More than 90% of lead

2410121447_HELE-X3S024000BK1H-Z_C254345.pdf

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