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Quality SMD Quartz Crystal Oscillator HD 8P100000301 Featuring 100 MHz Frequency and 30ppm Stability for Electronics factory
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Quality SMD Quartz Crystal Oscillator HD 8P100000301 Featuring 100 MHz Frequency and 30ppm Stability for Electronics factory
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Specifications
Frequency:
100MHz
Mfr. Part #:
8P100000301
Package:
SMD7050-4P
Key Attributes
Model Number: 8P100000301
Product Description

Jiangsu HD-Crystal Technology CO.,LTD - QMEMS7050/100.000M/3.3V/30PPM Quartz Crystal Oscillator

Product Overview

This specification applies to the RoHS crystal oscillator with a frequency of 100.000MHz, designed for use in electronic equipment. It features a compact SMD 7.0x5.0 package and offers a nominal frequency of 100.000MHz with a frequency stability of 30ppm over various conditions including temperature, voltage, load, and aging.

Product Attributes

  • Brand: HD-Crystal
  • Origin: Jiangsu, China
  • Certifications: RoHS

Technical Specifications

P/N Type Nominal Frequency Frequency Stability Aging Operating Temperature Range Storage Temperature Range Input Voltage (VDD) Input Current (IDD) Output Load Start-up Time Standby Current Phase Jitter (rms) Oscillation Mode Package
8P100000301 Quartz Crystal Oscillator 100.000MHz (30ppm) 30ppm (incl. 25C tolerance, tolerance over operating temperature range, input voltage change, load change, 1 year aging) 3ppm/year Max -40 to + 85C -55 to +125C +3.3Vdc10% 36mA max 15pF 55ms max 10A max 1ps rms max (12kHz to 20MHz) Fundmental SMD 7.0x5.0

Reliability Specification

Item Test Method Specification
Low Temperature Storage GB/T 2423.1-2001, Method Aa Frequency change after test 5ppm.
Humidity GB/T 2423.3- 2006, Method Cab Frequency change after test 5ppm.
High Temperature Storage GB/T 2423.2-2001, Method Ba Frequency change after test 5ppm.
Temperature Cycle GB/T 2423.22-2002, Method Nb Frequency change after test 5ppm.
Vibration GB/T 2423.10- 1995, Method Fc Frequency change after test 5ppm.
Shock GB/T 2423.5-1995, Method Ea Frequency change after test 5ppm.
Solderability GB/T 2423.28-2005, Method Tc Terminals shall be covered more then 95% with solder.
Resistance to Soldering Heat GB/T 2423.28-2005, Test Tb Method 1B Frequency change after test 5ppm. No visible damages.
Drop GB/T 2423.8-1995, Method Ed Frequency change after test 5ppm. No visible damages.
Terminal Strength JIS-C- 6429 Method 1 & 2 No visible damage

2411121116_HD-8P100000301_C5184788.pdf

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