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Quality Frequency 75.000MHz Crystal Oscillator SMD 7.0x5.0 Package Stability 30ppm HD 8P075000301 Components factory
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Quality Frequency 75.000MHz Crystal Oscillator SMD 7.0x5.0 Package Stability 30ppm HD 8P075000301 Components factory
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Specifications
Frequency:
75MHz
Mfr. Part #:
8P075000301
Package:
SMD7050-4P
Key Attributes
Model Number: 8P075000301
Product Description

Product Overview

This specification applies to the RoHS crystal oscillator with a frequency of 75.000MHz, designed for use in electronic equipment. It features a SMD 7.0x5.0 package and offers a nominal frequency of 75.000MHz with a frequency stability of 30ppm.

Product Attributes

  • Brand: JIANGSU HD-CRYSTAL TECHNOLOGY CO.,LTD
  • Origin: China (Jiangyin, Jiangsu Province)
  • Certifications: RoHS

Technical Specifications

ItemSpecification
Nominal Frequency75.000MHz (incl. 25C tolerance, tolerance over operating temperature range, input voltage change, load change, 1 year aging)
Frequency Stability30ppm
Aging3ppm/year Max
Operating Temperature Range-40 to +85C
Storage Temperature Range-55 to +125C
Input Voltage (VDD)+3.3Vdc10%
Input Current (IDD)36mA max
Output WaveformCMOS
Output Symmetry45%~ 55%
Rise/Fall Time5ns max
Output Voltage VOL: VOH10%VDD : 90%VDD
Output Load15pF
Output State ControlEnable/disable
Start-up Time55ms max
Standby current10A max
Phase Jitter (rms)1ps rms max (12kHz to 20MHz)
Oscillation modeFundamental
PackageSMD 7.05.0
Product SeriesQMEMS7050 / 8P series
Part Number8P075000301
RevisionA/1
Date of Issue2020/1/1

Reliability Specification

ItemTest MethodSpecification
Low Temperature StorageGB/T 2423.1-2001, Method AaSpending 72 hrs at -55C3C constant temperature. Measurement taken after DUT being left at room temperature for 242 hours. Frequency change after test 5ppm.
High Temperature StorageGB/T 2423.2-2001, Method BaSpending 72 hrs at 125C3C constant temperature. Measurement taken after DUT being left at room temperature for 242 hours. Frequency change after test 5ppm.
HumidityGB/T 2423.3- 2006, Method CabSpending 96 hrs at 40 C 3 C, with 90 3% R.H. Measurement taken after DUT being left at room temperature for 242 hours. Frequency change after test 5ppm.
Temperature CycleGB/T 2423.22-2002, Method Nb10 cycles from -55C to 125C. Measurement taken after DUT being left at room temperature for 242 hours. Frequency change after test 5ppm.
VibrationGB/T 2423.10- 1995, Method FcApply 0.75mm vibration at sweep frequency 10500 Hz, for 2h. 10 cycles in each direction of 3 axis. Measurement taken after 1 hour. Frequency change after test 5ppm. No visible damages.
ShockGB/T 2423.5-1995, Method EaPeak 1000m/s2, normal width 6ms half sine wave form, 3.7m/s, 3 perpendicular axis of samples, 3 cycles / direction, total 18 cycles. Measurement taken after 1 hour. Frequency change after test 5ppm. No visible damages.
SolderabilityGB/T 2423.28-2005, Method TcIn 245 5 solder bath for 2 0.5 seconds. Terminals shall be covered more then 95% with solder. There is no need to do functioned test.
Resistance to Soldering HeatGB/T 2423.28-2005, Test Tb Method 1BPassed through the re-flow oven under the following condition. Preheat to 150C5C for 60 to 120sec,and peak 265C5C for 10s3sec.Measurement taken after DUT being left at room temperature for at 242 hours. Frequency change after test 5ppm.
Terminal StrengthJIS-C- 6429 Method 1 & 2Mount on a glass-epoxy board (100x50x1.6mm), then bend to 2mm displacement (velocity 1mm/sec) and keep for 5 seconds. or pulling force 0.5 kg for at least 60 seconds. No visible damage.
DropGB/T 2423.8-1995, Method EdFree drop to the wooden plate from 1.0 m heights for 3 times. Measurement taken after 1 hour. Frequency change after test 5ppm. No visible damages.

Packing Specification

Qty: 1000Pcs


2411121116_HD-8P075000301_C5184787.pdf

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