Product Overview
The Jiangsu HD-Crystal Technology CO., LTD QMEMS2016 8T series quartz crystal oscillator is designed for use in electronic equipment. This RoHS-compliant oscillator offers a nominal frequency of 24.000MHz with a 30ppm frequency stability over a wide operating temperature range of -40 to +85C. It features a compact SMD 2.0x1.6mm package and supports CMOS output waveform with a standby current of 10A max.
Product Attributes
- Brand: JIANGSU HD-CRYSTAL TECHNOLOGY CO.,LTD
- Origin: China
- Certifications: RoHS
Technical Specifications
| Item | Specification | Details |
| Product Name | Quartz Crystal Oscillator | QMEMS2016 8T series |
| Part Number | 8T024000101 | |
| Nominal Frequency | 24.000MHz | (incl. 25C tolerance, tolerance over operating temperature range, input voltage change, load change, 1 year aging) |
| Frequency Stability | 30ppm | |
| Aging | 3ppm/year | |
| Operating Temperature Range | -40 to +85C | |
| Storage Temperature Range | -55 to +125C | |
| Input Voltage (VDD) | +1.8Vdc10% | |
| Input Current (IDD) | 20mA max | |
| Output Waveform | CMOS | |
| Output Symmetry | 5010% | |
| Rise/Fall Time | 8ns max | |
| Output Voltage VOL | 10%VDD | |
| Output Voltage VOH | 90%VDD | |
| Output Load | 15pF | |
| Output State Control | Enable/disable | |
| Start-up Time | 510ms max | |
| Standby Current | 10A max | |
| Phase Jitter (rms) | 1ps rms max | 12kHz to 20MHz |
| Oscillation Mode | Fundamental | |
| Package | SMD | 2.01.6mm |
| Construction | ||
| Product Description | RoHS crystal oscillator | for electronic equipment |
| Reliability - Low Temperature Storage | GB/T 2423.1-2001, Method Aa | Frequency change after test 5ppm |
| Reliability - High Temperature Storage | GB/T 2423.2-2001, Method Ba | Frequency change after test 5ppm |
| Reliability - Humidity | GB/T 2423.3-2006, Method Cab | Frequency change after test 5ppm |
| Reliability - Temperature Cycle | GB/T 2423.22-2002, Method Nb | Frequency change after test 5ppm |
| Reliability - Vibration | GB/T 2423.10-1995, Method Fc | Frequency change after test 5ppm |
| Reliability - Shock | GB/T 2423.5-1995, Method Ea | Frequency change after test 5ppm |
| Reliability - Solderability | GB/T 2423.28-2005, Method Tc | Terminals shall be covered more then 95% with solder. |
| Reliability - Resistance to Soldering Heat | GB/T 2423.28-2005, Test Tb Method 1B | Frequency change after test 5ppm. No visible damages. |
| Reliability - Drop | GB/T 2423.8-1995, Method Ed | Frequency change after test 5ppm. No visible damages. |
| Reliability - Terminal Strength | JIS-C-6429 Method 1 & 2 | No visible damage |
| Packing Specification | Qty:3000Pcs |
2411121116_HD-8T024000101_C5184804.pdf
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