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Quality Electronic Quartz Crystal Oscillator HD 8T024000101 with 24 MHz Nominal Frequency and 30ppm Stability factory
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Quality Electronic Quartz Crystal Oscillator HD 8T024000101 with 24 MHz Nominal Frequency and 30ppm Stability factory
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Specifications
Frequency:
24MHz
Mfr. Part #:
8T024000101
Package:
SMD2016-4P
Key Attributes
Model Number: 8T024000101
Product Description

Product Overview

The Jiangsu HD-Crystal Technology CO., LTD QMEMS2016 8T series quartz crystal oscillator is designed for use in electronic equipment. This RoHS-compliant oscillator offers a nominal frequency of 24.000MHz with a 30ppm frequency stability over a wide operating temperature range of -40 to +85C. It features a compact SMD 2.0x1.6mm package and supports CMOS output waveform with a standby current of 10A max.

Product Attributes

  • Brand: JIANGSU HD-CRYSTAL TECHNOLOGY CO.,LTD
  • Origin: China
  • Certifications: RoHS

Technical Specifications

ItemSpecificationDetails
Product NameQuartz Crystal OscillatorQMEMS2016 8T series
Part Number8T024000101
Nominal Frequency24.000MHz(incl. 25C tolerance, tolerance over operating temperature range, input voltage change, load change, 1 year aging)
Frequency Stability30ppm
Aging3ppm/year
Operating Temperature Range-40 to +85C
Storage Temperature Range-55 to +125C
Input Voltage (VDD)+1.8Vdc10%
Input Current (IDD)20mA max
Output WaveformCMOS
Output Symmetry5010%
Rise/Fall Time8ns max
Output Voltage VOL10%VDD
Output Voltage VOH90%VDD
Output Load15pF
Output State ControlEnable/disable
Start-up Time510ms max
Standby Current10A max
Phase Jitter (rms)1ps rms max12kHz to 20MHz
Oscillation ModeFundamental
PackageSMD2.01.6mm
Construction
Product DescriptionRoHS crystal oscillatorfor electronic equipment
Reliability - Low Temperature StorageGB/T 2423.1-2001, Method AaFrequency change after test 5ppm
Reliability - High Temperature StorageGB/T 2423.2-2001, Method BaFrequency change after test 5ppm
Reliability - HumidityGB/T 2423.3-2006, Method CabFrequency change after test 5ppm
Reliability - Temperature CycleGB/T 2423.22-2002, Method NbFrequency change after test 5ppm
Reliability - VibrationGB/T 2423.10-1995, Method FcFrequency change after test 5ppm
Reliability - ShockGB/T 2423.5-1995, Method EaFrequency change after test 5ppm
Reliability - SolderabilityGB/T 2423.28-2005, Method TcTerminals shall be covered more then 95% with solder.
Reliability - Resistance to Soldering HeatGB/T 2423.28-2005, Test Tb Method 1BFrequency change after test 5ppm. No visible damages.
Reliability - DropGB/T 2423.8-1995, Method EdFrequency change after test 5ppm. No visible damages.
Reliability - Terminal StrengthJIS-C-6429 Method 1 & 2No visible damage
Packing SpecificationQty:3000Pcs

2411121116_HD-8T024000101_C5184804.pdf

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