Product Overview
This specification applies to the RoHS crystal oscillator with a frequency of 26.000 MHz, designed for use in electronic equipment. It features a SMD 3.2x2.5 package and CMOS output waveform, with a frequency stability of 50ppm and an operating temperature range of -40 to +85C. The oscillator is suitable for general electronic applications and is not recommended for safety-critical applications.
Product Attributes
- Brand: JIANGSU HD-CRYSTAL TECHNOLOGY CO., LTD
- Origin: China
- Certifications: RoHS
Technical Specifications
| Item | Specification | Nominal Frequency | Frequency Stability | Aging | Operating Temperature Range | Storage Temperature Range | Input Voltage (VDD) | Input Current (IDD) | Output Waveform | Output Symmetry | Rise/Fall Time | Output Voltage VOL:VOH | Output Load | Output State Control | Start-up Time | Standby Current | Phase Jitter (rms) | Oscillation Mode |
| SMD 3.2x2.5 XO | SMD3225-4 Crystal Oscillator | 26.000 MHz | 50ppm (incl. 25C tolerance, tolerance over operating temperature range, input voltage change, load change, 1 year aging) | 3ppm/year | -40 to +85C | -55 to +125C | +3.3Vdc10% | 10mA max | CMOS | 5010% | 8ns max | 10%VDD 90%VDD | 15pF | Enable/disable | 510ms max | 10A max | 1ps rms max (12kHz to 20MHz) | Fundamental |
Reliability Specifications
| Item | Test Method | Specification | Procedure |
| Low Temperature Storage | GB/T 2423.1-2001, Method Aa | Frequency change after test 5ppm. | Spending 72 hrs at -55C3C constant temperature. Measurement taken after DUT being left at room temperature for 242 hours. |
| Humidity | GB/T 2423.3- 2006, Method Cab | Frequency change after test 5ppm. | Spending 96 hrs at 40 C 3 C, with 90 3% R.H. Measurement taken after DUT being left at room temperature for 242 hours. |
| High Temperature Storage | GB/T 2423.2-2001, Method Ba | Frequency change after test 5ppm. | Spending 72 hrs at 125C3C constant temperature. Measurement taken after DUT being left at room temperature for 242 hours. |
| Temperature Cycle | GB/T 2423.22-2002, Method Nb | Frequency change after test 5ppm. | 10 cycles from -55C to 125C. Measurement taken after DUT being left at room temperature for 242 hours. |
| Vibration | GB/T 2423.10- 1995, Method Fc | Frequency change after test 5ppm. | Apply 0.75mm vibration at sweep frequency 10500 Hz, for 2h. 10 cycles in each direction of 3 axis. Measurement taken after 1 hour. |
| Shock | GB/T 2423.5-1995, Method Ea | Frequency change after test 5ppm. | Peak 1000m/s2, normal width 6ms half sine wave form, 3.7m/s, 3 perpendicular axis of samples, 3 cycles / direction, total 18 cycles. Measurement taken after 1 hour. |
| Solderability | GB/T 2423.28-2005, Method Tc | Terminals shall be covered more then 95% with solder. | In 245 5 solder bath for 2 0.5 seconds. There is no need to do functioned test. |
| Resistance to Soldering Heat | GB/T 2423.28-2005, Test Tb Method 1B | Frequency change after test 5ppm. No visible damages. | Passed through the re-flow oven under the following condition. Preheat to 150C5C for 60 to 120sec,and peak 265C5C for 10s3sec.Measurement taken after DUT being left at room temperature for at 242 hours. |
| Drop | GB/T 2423.8-1995, Method Ed | No visible damages. | Free drop to the wooden plate from 1.0 m heights for 3 times. |
| Terminal Strength | JIS-C- 6429 Method 1 & 2 | No visible damage | Mount on a glass-epoxy board (100x50x1.6mm), then bend to 2mm displacement (velocity 1mm/sec) and keep for 5 seconds. or pulling force 0.5 kg for at least 60 seconds. 8-12X magnifier. |
2409302231_HD-83026000301_C5272982.pdf
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