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quality SMD Crystal Oscillators 2.5x2.0 CMOS Output CHANGXING ELECTRONICS 4ESC480C0033L for WLAN Bluetooth DSC and DSL applications factory
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quality SMD Crystal Oscillators 2.5x2.0 CMOS Output CHANGXING ELECTRONICS 4ESC480C0033L for WLAN Bluetooth DSC and DSL applications factory
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Specifications
Normal temperature Frequency Tolerance:
±10ppm
Voltage - Supply:
1.8V~3.3V
Operating Temperature:
-40℃~+85℃
Frequency:
48MHz
Mfr. Part #:
4ESC480C0033L
Package:
SMD2520-4P
Key Attributes
Model Number: 4ESC480C0033L
Product Description

Product Overview

This document details the specification for the 2.5x2.0 SMD Crystal Oscillators with CMOS Output, part of the 4E Series from CHANGXING ELECTRONICS CO.,LTD. These ultra-small, seam-sealed clock crystal oscillator units are designed for applications in WLAN, Bluetooth, DSC, DSL, and other IT products. They feature a tri-state function and are RoHS Compliant / Pb Free.

Product Attributes

  • Brand: CHANGXING ELECTRONICS CO.,LTD.
  • Product Series: 4E Series
  • Product Type: SMD Crystal Oscillators
  • Output Type: CMOS Output
  • Certifications: RoHS Compliant / Pb Free
  • Origin: Fujian Province, China

Technical Specifications

Specification Value Unit Condition/Notes
Nominal Frequency 48.000000 MHz
Tolerance @ 25 Degree 10 ppm
Stability over Operation Temp. 20 ppm -4085
Aging 3 ppm/year
Operating Temperature Range -55125
Storage Temperature Range -4085
Supply Voltage (Vdd) 1.83.3 Vdc
Supply Current (Icc) 15 mA max
Standby current 10 A max
Output Load 10 pF max
Output Symmetry 5010%
Output Waveform CMOS
Rise/Fall Time 15 ns max
Output Voltage VOL 10%VDD min
Output Voltage VOH 90%VDD min
Enable Voltage High 70%Vdd min
Disable Voltage Low 30%Vdd max
Start-up Time 5 ms max
Phase Jitter(12KHz 20MHz) 3 ps max
Output State Control Enable/disable
Fundamental Oscillation mode
Dimensions 2.52.00.8 mm (SMD)
MSL Level 1 IPC/JEDEC J-STD-033C
Product Weight 13.843 mg (OSC 2520)

Marking Code

The marking code consists of: CHANGXING ELECTRONICS LOGO, Nominal Frequency (MHz), Line Code, Last three digits of Production Batch Code, Year-Month Code.

Reflow Condition

Solder profile: Peak: 250+50, Soldering zone: 230 or more, 3010s. Pre-heating zone 1: 150180, 9030s.

Soldering iron method: Bit temperature: 35010, Application time of soldering iron: 3+1 s.

Packing

EIA-481-2 standard packaging is used.

Reliability Specifications

Standard test condition: TEMP.: 2015, Relative humidity: 6520%. For any discrepancy in GO/NG, test will be done at TEMP. 252, R.H. 655%.

No. SPECIFICATION ITEM TEST METHOD Frequency change after test Notes
1 Resistance to SolderingHeat GB/T 2423.28-2005, Test Tb Method 1B 5ppm Passed through re-flow oven (Preheat 150C5C for 60-120s, peak 265C5C for 10s3s). Measurement after 242 hours at room temperature.
2 Solderability GB/T 2423.28-2005, Method Tc Terminals shall be covered more than 95% with solder. No visible damage.
3 Terminal Strength JIS-C- 6429 Method 1 & 2 Mount on glass-epoxy board, bend 2mm displacement (velocity 1mm/sec) and hold for 5s, or pulling force 0.5 kg for 60s. No visible damages.
4 Drop GB/T 2423.8-1995, Method Ed 5ppm Free drop from 1.0 m height for 3 times. Measurement after 1 hour.
5 Vibration GB/T 2423.10-1995, Method Fc 5ppm Apply 0.75mm vibration at sweep frequency 10500 Hz, for 2h. 10 cycles in each direction of 3 axes. Measurement after 1 hour.
6 Shock GB/T 2423.5-1995, Method Ea 5ppm Peak 1000m/s, normal width 6ms half sine wave, 3.7m/s, 3 perpendicular axes, 3 cycles/direction, total 18 cycles. Measurement after 1 hour.
7 Humidity GB/T 2423.3-2006, Method Cab 5ppm Spending 96 hrs at 40 C 3 C, with 90 3% R.H. Measurement after 242 hours at room temperature.
8 Temperature Cycle GB/T2423.22-2002, Method Nb 5ppm 10 cycles from -25C to 85C. Measurement after 242 hours at room temperature.
9 High Temperature Storage GB/T 2423.2-2001, Method Ba 5ppm Spending 72 hrs at 125C3C. Measurement after 242 hours at room temperature.
10 Low Temperature Storage GB/T 2423.1-2001, Method Aa 5ppm Spending 72 hrs at -55C3C. Measurement after 242 hours at room temperature.

Component Material Analysis

No. PRODUCTION NAME Name of Part Material Name Constituent name CAS No. Material Analysis (%)
1 OSC 2520 Base () Ceramics () Aluminum oxide (Al2O3) 1344-28-1 63.88%
Silica (SiO2) 14464-46-1 3.79%
Chromium oxide (Cr2o3) 1308-38-9 1.29%
Molybdenum (Mo) 7439-98-7 1.00%
Iron (Fe) 7440-33-7 9.25%
Nickel (Ni) 7439-89-6 8.85%
Cobalt (Co) 7440-02-0 4.75%
Silver (Ag) 7440-48-4 2.98%
Copper (Cu) 7440-22-4 2.80%
2 Lid () Kovar Tungsten (W) 7440-50-8 1.04%
Gold (Au) 7440-02-0 0.24%
Nickel (Ni) 7440-57-5 0.13%
Metallization () Iron (Fe) 7439-89-6 54.00%
Cobalt (Co) 7440-48-4 17.02%
Nickel (Ni) 7440-02-0 28.32%
Plate () Nickel (Ni) () Nickel (Ni) 7440-02-0 0.66%
3 Adhesive Resin () Epoxy () Bisphenol A-epichlorohydrin polymer 25068-38-6 0.60%
Xylenes (o-, m-, p-isomers) 1330-20-7 0.60%
Ethylbenzene 100-41-4 0.06%
Silicone resin () Silicone resin - 8.62%
Silica () Silica - 8.52%
Petroleum solvents () Petroleumsolvents - 7.00%
Ethyl alcohol () Ethyl alcohol 64-17-5 0.60%
4 Blank () Quartz () Silicon oxide (SiO2) 14808-60-7 100.00%
5 Wire () Gold () Gold (Au) 7440-57-5 100.00%
6 IC Silicon () Silicon 7440-21-3 100.00%
7 Electrode () Silver () Silver (Ag) 7440-22-4 100.00%
Solder () Silver (Ag) 7440-22-4 74.00%
Tin 7440-31-5 26.00%

2512081627_CHANGXING-ELECTRONICS-4ESC480C0033L_C48927845.pdf

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