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quality CMOS Output Quartz Crystal Oscillator 16 MHz CHANGXING ELECTRONICS 9ESC160C0033L SMD Package RoHS Compliant factory
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quality CMOS Output Quartz Crystal Oscillator 16 MHz CHANGXING ELECTRONICS 9ESC160C0033L SMD Package RoHS Compliant factory
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Specifications
Normal temperature Frequency Tolerance:
±10ppm
Voltage - Supply:
1.8V~3.3V
Operating Temperature:
-40℃~+85℃
Frequency:
16MHz
Mfr. Part #:
9ESC160C0033L
Package:
SMD5032-4P
Key Attributes
Model Number: 9ESC160C0033L
Product Description

Product Overview

The 9ESC160C0033L is a 5.0x3.2mm SMD Crystal Oscillator from CHANGXING ELECTRONICS CO.,LTD. This CMOS output oscillator offers high precision across a wide frequency range, designed for automatic mounting and reflow soldering. It features a Tri-State function, a supply voltage range of 1.8V to 5.0V, high stability, low jitter, and low power consumption. Ideal for applications in wireless communication sets, PDAs, and DSCs, this RoHS Compliant / Pb Free product ensures reliable performance.

Product Attributes

  • Brand: CHANGXING ELECTRONICS CO.,LTD.
  • Series: 9E Series
  • Product Type: Quartz Crystal Oscillator
  • Output Type: CMOS Output
  • Mounting Type: SMD (Surface Mount Device)
  • Certifications: RoHS Compliant / Pb Free
  • Origin: Fujian Province, China

Technical Specifications

Specification Value Unit Notes
Nominal Frequency 16.000000 MHz
Tolerance @ 25 Degree 10 ppm
Stability over Operation Temp. 20 ppm -4085
Aging 3 ppm/year
Operating Temperature Range -4085
Storage Temperature Range -55125
Supply Voltage (Vdd) 1.8 ~ 5.0 Vdc
Supply Current (Icc) 5.0 mA max @ 1.8V~3.3V
Standby current 1.0 A max
Output State Control Enable/disable
Enable Voltage High 70%Vdd min
Disable Voltage Low 30%Vdd max
Rise/Fall Time 15 ns max
Output Voltage VOL 10%VDD min
Output Voltage VOH 90%VDD min
Output Load 15 pF max
Output Waveform CMOS
Output Symmetry 5010%
Start-up Time 5 ms max
Phase Jitter(12KHz 20MHz) 5 ps max
Fundamental Oscillation mode 3 Level 1
MSL 2 IPC/JEDEC J-STD-033C
Dimensions 5.0x3.2x1.2 mm SMD
Product Model 9ESC160C0033L
Product No. OSC 16.000000MHz 5.0x3.2
Product Weight 55.653 mg

Reflow Condition

Soldering profile: Peak: 250+50, Soldering zone: 230 or more, 3010s. Pre-heating zone 1: 150180, 9030s.

Soldering iron method: Bit temperature: 35010, Application time of soldering iron: 31 s. For other procedures, refer to IEC 60068-2-20.

Packing

EIA-481-2 TAPE (CARRIER) DIMENSIONS

Reliability Specifications

Standard test condition (TEMP.: 2015. Relative humidity: 6520%). For any discrepancy in GO/NG, test will be done at TEMP. 252. R.H. 655%.

ITEM TEST METHOD SPECIFICATION
Drop GB/T 2423.8-1995, Method Ed Free drop to the wooden plate from 1.0 m heights for 3 times. Frequency change after test5ppm. No visible damages.
Vibration GB/T 2423.10-1995, Method Fc Apply 0.75mm vibration at sweep frequency 10500 Hz, for 2h. 10 cycles in each direction of 3 axis. Measurement taken after 1 hour. Frequency change after test5ppm. No visible damages.
Resistance to Soldering Heat GB/T 2423.28-2005, Test Tb Method 1B In 255 5 solder bath for 2 0.5 seconds. Measurement taken after DUT being left at room temperature for 242 hours. Frequency change after test5ppm. No visible damages. Terminals shall be covered more than 95% with solder.
Temperature Cycle GB/T2423.22-2002, Method Nb 10 cycles from -25C to 85C. Measurement taken after DUT being left at room temperature for 242 hours. Frequency change after test5ppm. No visible damages.
Low Temperature Storage GB/T 2423.1-2001, Method Aa Spending 72 hrs at -55C3C constant temperature. Measurement taken after DUT being left at room temperature for 242 hours. Frequency change after test5ppm. No visible damages.
Humidity GB/T 2423.3-2006, Method Cab Spending 96 hrs at 40 C 3 C, with 90 3% R.H. Measurement taken after DUT being left at room temperature for 242 hours. Frequency change after test5ppm. No visible damages.
Shock GB/T 2423.5-1995, Method Ea Peak 1000m/s2, normal width 6ms half sine wave form, 3.7m/s, 3 perpendicular axis of samples, 3 cycles /direction, total 18 cycles. Measurement taken after 1 hour. Frequency change after test5ppm. No visible damages.
High Temperature Storage GB/T 2423.2-2001, Method Ba Spending 72 hrs at 125C3C constant temperature. Measurement taken after DUT being left at room temperature for 242 hours. Frequency change after test5ppm. No visible damages.
Solderability GB/T 2423.28-2005, Method Tc Mount on a glass-epoxy board (100x50x1.6mm), then bend to 2mm displacement (velocity 1mm/sec) and keep for 5 seconds. or pulling force 0.5 kg for at least 60 seconds. Frequency change after test5ppm. No visible damages.
Terminal Strength JIS-C-6429 Method 1 & 2 Passed through the re-flow oven under the following condition. Preheat to 150 C5C for 60 to 120sec, and peak 265 C5C for 10s3sec. Measurement taken after DUT being left at room temperature for at 242 hours. Frequency change after test5ppm. No visible damages.

Material Composition Declaration

No. Name of Part Material Name Constituent name CAS No. Material Analysis(%)
1 Base Ceramics Al2O3 1344-28-1 63.88%
SiO2 14464-46-1 3.79%
Cr2o3 1308-38-9 1.29%
Mo 7439-98-7 1.00%
Fe 7440-33-7 9.25%
Ni 7439-89-6 8.85%
Co 7440-02-0 4.75%
Ag 7440-48-4 2.98%
Cu 7440-22-4 2.80%
2 Metallization W Tungsten 7440-50-8 1.04%
Au 7440-02-0 0.24%
Ni 7440-57-5 0.13%
Fe 7439-89-6 54.00%
Co 7440-48-4 17.02%
Ni 7440-02-0 28.32%
Plate Ni Nickel 7440-02-0 0.66%
3 Adhesive Resin - - - 100.00%
4 Blank Quartz SiO2 Silicon oxide 14808-60-7 100.00%
5 Wire Gold Au Gold 7440-57-5 100.00%
6 IC Silicon Silicon 7440-21-3 100.00%
7 Electrode Electrode Ag Silver 7440-22-4 100.00%
Silver Silver 7440-22-4 74.00%
Ethyl alcohol Ethyl alcohol 64-17-5 0.60%
Bisphenol A-epichlorohydrin polymer Bisphenol A-epichlorohydrin polymer 25068-38-6 0.60%
Xylenes (o-, m-, p-isomers) Xylenes (o-, m-, p-isomers) 1330-20-7 0.60%
Ethylbenzene Ethylbenzene 100-41-4 0.06%
Silicone resin Silicone resin - 8.62%
Silica Silica - 8.52%
Petroleum solvents Petroleum solvents - 7.00%
Lid Kovar 8.00
Epoxy Conductive Resin

2512081627_CHANGXING-ELECTRONICS-9ESC160C0033L_C48927849.pdf

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