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quality Quartz Crystal Oscillator CHANGXING ELECTRONICS 7ESC240C0033L 24MHz CMOS Output Stable Frequency factory
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quality Quartz Crystal Oscillator CHANGXING ELECTRONICS 7ESC240C0033L 24MHz CMOS Output Stable Frequency factory
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Specifications
Normal temperature Frequency Tolerance:
±10ppm
Voltage - Supply:
1.8V~3.3V
Operating Temperature:
-40℃~+85℃
Frequency:
24MHz
Mfr. Part #:
7ESC240C0033L
Package:
SMD7050-4P
Key Attributes
Model Number: 7ESC240C0033L
Product Description

Product Overview

The 7ESC240C0033L is a 7.0x5.0mm SMD Crystal Oscillator from CHANGXING ELECTRONICS CO.,LTD. This CMOS output oscillator offers high precision across a wide frequency range, designed for automatic mounting and reflow soldering. It features a Tri-State function, a supply voltage range of 1.8V to 5.0V, high stability, low jitter, and low power consumption. Ideal for applications in wireless communication, PCs, and LCDMs, this product is RoHS Compliant and Pb Free.

Product Attributes

  • Brand: CHANGXING ELECTRONICS CO.,LTD.
  • Product Type: Quartz Crystal Oscillator
  • Series: 7E Series
  • Output Type: CMOS Output
  • Certifications: RoHS Compliant / Pb Free
  • MSL Level: 1

Technical Specifications

Specification Value Unit
Model 7ESC240C0033L
Nominal Frequency 24.000000 MHz
Tolerance @ 25 Degree 10 ppm
Stability over Operation Temp. 20 ppm
Operating Temperature Range -4085
Storage Temperature Range -55125
Supply Voltage (Vdd) 1.8V5.0V Vdc
Supply Current (Icc) 5 mA max
Standby current (1.8V3.3V) 10 A max
Phase Jitter (12KHz 20MHz) 5 ps max
Aging 3 ppm/year
Rise/Fall Time 5 ns max
Output Voltage VOL 30%Vdd max
Output Voltage VOH 70%Vdd min
Output Load 15 pF
Start-up Time 10 ms max
Output State Control Enable/disable
Enable Voltage High 5010% %VDD
Disable Voltage Low 1.8V V
Dimensions 7.0x5.0x1.3mm SMD
Product No. 7ESC240C0033L
Product Name OSC 7050
Production Weight 123.031 mg

Reflow Condition

Soldering iron method:

  • Bit temperature: 35010
  • Application time of soldering iron: 31 s

Solder profile:

  • Peak: 250+50
  • Soldering zone: 230 or more, 3010s.
  • Pre-heating zone 1: 150180, 9030s

For other procedures, refer to IEC 60068-2-20.

Reliability Specifications

Item Test Method Specification Measurement Timing
Temperature Cycle GB/T2423.22-2002, Method Nb (10 cycles from -25C to 85C) Frequency change after test5ppm. No visible damages. After DUT being left at room temperature for 242 hours.
Low Temperature Storage GB/T2423.1-2001, Method Aa (Spending 72 hrs at -55C3C) Frequency change after test5ppm. No visible damages. After DUT being left at room temperature for 242 hours.
Humidity GB/T2423.3-2006, Method Cab (Spending 96 hrs at 40 C 3 C, with 90 3% R.H.) Frequency change after test5ppm. No visible damages. After DUT being left at room temperature for 242 hours.
High Temperature Storage GB/T2423.2-2001, Method Ba (Spending 72 hrs at 125C3C) Frequency change after test5ppm. No visible damages. After DUT being left at room temperature for 242 hours.
Drop GB/T 2423.8-1995, Method Ed (Free drop to the wooden plate from 1.0 m heights for 3 times) Frequency change after test5ppm. No visible damages. Measurement taken after 1 hour.
Vibration GB/T 2423.10-1995, Method Fc (Apply 0.75mm vibration at sweep frequency 10500 Hz, for 2h. 10 cycles in each direction of 3 axis) Frequency change after test5ppm. No visible damages. Measurement taken after DUT being left at room temperature for 242 hours.
Resistance to Soldering Heat GB/T 2423.28-2005, Test Tb Method 1B (Passed through the re-flow oven under the following condition: Preheat to 150 C5C for 60 to 120sec, and peak 265 C5C for 10s3sec) Frequency change after test5ppm. No visible damages. Measurement taken after DUT being left at room temperature for 242 hours.
Shock GB/T 2423.5-1995, Method Ea (Peak 1000m/s2, normal width 6ms half sine wave form, 3.7m/s, 3 perpendicular axis of samples, 3 cycles /direction, total 18 cycles) Frequency change after test5ppm. No visible damages. Measurement taken after 1hour.
Solderability GB/T 2423.28-2005, Method Tc (In 255 5 solder bath for 2 0.5 seconds) Terminals shall be covered more than 95% with solder. No visible damage. (8-12X magnifier) There is noneed to do functioned test.
Terminal Strength JIS-C-6429 Method 1 & 2 (Mount on a glass-epoxy board (100x50x1.6mm), then bend to 2mm displacement (velocity 1mm/sec) and keep for 5 seconds. or pulling force 0.5 kg for at least 60 seconds) Frequency change after test5ppm. No visible damages. Measurement taken after DUT being left at room temperature for 242 hours.

Material Composition Declaration

No. Name of Part Material Name Constituent name CAS No. Material Analysis(%)
1 Base Ceramics Al2O3 1344-28-1 63.88%
SiO2 14464-46-1 3.79%
Cr2o3 1308-38-9 1.29%
Mo 7439-98-7 1.00%
Fe 7439-89-6 8.85%
Ni 7440-02-0 4.75%
Co 7440-48-4 2.98%
Ag 7440-22-4 2.80%
Cu 7440-50-8 1.04%
Metallization W 7440-33-7 9.25%
Au 7440-57-5 0.13%
Ni 7440-02-0 0.24%
Fe 7439-89-6 54.00%
Co 7440-48-4 17.02%
Ni 7440-02-0 28.32%
Plate Ni 7440-02-0 0.66%
2 Adhesive Resin - - 100.00%
3 Blank Quartz SiO2 14808-60-7 100.00%
4 Wire Gold Au 7440-57-5 100.00%
5 IC Ssilicon Silicon Silicon 7440-21-3 100.00%
6 Electrode Electrode Ag 7440-22-4 100.00%
7 Lid Kovar Ag 7440-22-4 74.00%
Ethyl alcohol 64-17-5 0.60%
Bisphenol A-epichlorohydrin polymer 25068-38-6 0.60%
Xylenes (o-, m-, p-isomers) 1330-20-7 0.60%
Ethylbenzene 100-41-4 0.06%
Silicone resin - 8.62%
Silica - 8.52%
Petroleumsolvents - 7.00%

2512081627_CHANGXING-ELECTRONICS-7ESC240C0033L_C48927861.pdf

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