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quality RoHS Compliant Pb Free Quartz Crystal Oscillator CHANGXING ELECTRONICS 7ESC300C0033L for PC and LCDM factory
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quality RoHS Compliant Pb Free Quartz Crystal Oscillator CHANGXING ELECTRONICS 7ESC300C0033L for PC and LCDM factory
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Specifications
Normal temperature Frequency Tolerance:
±10ppm
Voltage - Supply:
1.8V~3.3V
Operating Temperature:
-40℃~+85℃
Frequency:
30MHz
Mfr. Part #:
7ESC300C0033L
Package:
SMD7050-4P
Key Attributes
Model Number: 7ESC300C0033L
Product Description

Product Overview

The CHANGXING ELECTRONICS CO.,LTD. 7E Series Quartz Crystal Oscillator is a small SMD seam-sealed clock crystal oscillator unit designed for automatic mounting and reflow soldering. It offers high precision across a wide frequency range, featuring a Tri-State function, a supply voltage range of 1.8 V to 5.0 V, high stability, low jitter, and low power consumption. This product is RoHS Compliant and Pb Free, making it suitable for applications in wireless communication, PCs, and LCDMs.

Product Attributes

  • Brand: CHANGXING ELECTRONICS CO.,LTD.
  • Origin: Fujian, China
  • Certifications: RoHS Compliant / Pb Free
  • Series: 7E Series
  • Packaging: EIA-481-2
  • MSL Level: 1 (IPC/JEDEC J-STD-033C)

Technical Specifications

Specification Value Unit
Nominal Frequency 30.000000 MHz
Tolerance @ 25 Degree 10 ppm
Stability over Operation Temp. 20 ppm/year
Operating Temperature Range -4085
Storage Temperature Range -55125
Supply Voltage (Vdd) 1.8V3.3V Vdc
Supply Current (Icc) 5 A max
Standby current (1.8V~3.3V) 5010% A max
Phase Jitter (12KHz 20MHz) 5 ps max
Rise/Fall Time 5 ns max
Output Voltage VOL 30%Vdd max
Output Voltage VOH 70%Vdd min
Output Load 15 pF
Start-up Time 10 ms max
Output Symmetry 5010%
Fundamental Oscillation mode
Output State Control Enable/disable
Product Model 7.0x5.0x1.3mm SMD Crystal Oscillators CMOS Output / 7E Series
Product Code 7ESC300C0033L
Product Weight 123.031 mg
Dimensions 7.05.0x1.3mm SMD

Reflow Condition

Temperature profile for reflow soldering:
Peak: 250+50
Soldering zone: 230 or more, 3010s.
Pre-heating zone 1: 150180, 9030s

Soldering iron method:
Bit temperature: 35010
Application time of soldering iron: 31 s

For other procedures, refer to IEC 60068-2-20.

Reliability Specifications

ITEM TEST METHOD SPECIFICATION
Temperature Cycle GB/T2423.22-2002, Method Nb (10 cycles from -25C to 85C. Measurement taken after DUT being left at room temperature for 242 hours.) Frequency change after test5ppm.
Low Temperature Storage GB/T2423.1-2001, Method Aa (Spending 72 hrs at -55C3C constant temperature. Measurement taken after DUT being left at room temperature for 242 hours.) Frequency change after test5ppm.
Humidity GB/T2423.3-2006, Method Cab (Spending 96 hrs at 40 C 3 C, with 90 3% R.H. Measurement taken after DUT being left at room temperature for 242 hours.) Frequency change after test5ppm.
High Temperature Storage GB/T2423.2-2001, Method Ba (Spending 72 hrs at 125C3C constant temperature. Measurement taken after DUT being left at room temperature for 242 hours.) Frequency change after test5ppm. No visible damages.
Drop GB/T 2423.8-1995, Method Ed (Free drop to the wooden plate from 1.0 m heights for 3 times.) Frequency change after test5ppm.
Vibration GB/T 2423.10-1995, Method Fc (Apply 0.75mm vibration at sweep frequency 10500 Hz, for 2h. 10 cycles in each direction of 3 axis. Measurement taken after 1 hour.) Frequency change after test5ppm.
Resistance to Soldering Heat GB/T 2423.28-2005, Test Tb Method 1B (Passed through the re-flow oven under the following condition. Preheat to 150 C5C for 60 to 120sec, and peak 265 C5C for 10s3sec. Measurement taken after DUT being left at room temperature for at 242 hours.) Frequency change after test5ppm.
Shock GB/T 2423.5-1995, Method Ea (Peak 1000m/s2, normal width 6ms half sine wave form, 3.7m/s, 3 perpendicular axis of samples, 3 cycles /direction, total 18 cycles. Measurement taken after 1 hour.) Frequency change after test5ppm.
Solderability GB/T 2423.28-2005, Method Tc (In 255 5 solder bath for 2 0.5 seconds. 8-12X magnifier.) Terminals shall be covered more then 95% with solder. No visible damage.
Terminal Strength JIS-C-6429 Method 1 & 2 (Mount on a glass-epoxy board (100x50x1.6mm), then bend to 2mm displacement (velocity 1mm/sec) and keep for 5 seconds. or pulling force 0.5 kg for at least 60 seconds.) Frequency change after test5ppm. No visible damages.

Material Composition Declaration

No. Name of Part Material Name Constituent name CAS No. Material Analysis(%)
1 Base Ceramics Al2O3 1344-28-1 63.88%
SiO2 14464-46-1 3.79%
Cr2o3 1308-38-9 1.29%
Mo 7439-98-7 1.00%
Fe 7439-89-6 8.85%
Ni 7440-02-0 4.75%
Co 7440-48-4 2.98%
Ag 7440-22-4 2.80%
Cu 7440-50-8 1.04%
Pin Solder W 7440-33-7 9.25%
Au 7440-57-5 0.13%
Ni 7440-02-0 0.24%
Fe 54.00%
Co 7440-48-4 17.02%
Ni 7440-02-0 28.32%
Plate Ni Ni 7440-02-0 0.66%
2 Adhesive Resin - - - 100.00%
3 Blank Quartz SiO2 14808-60-7 100.00%
4 Wire Gold Au 7440-57-5 100.00%
5 IC Silicon Silicon 7440-21-3 100.00%
6 Electrode Electrode Ag 7440-22-4 100.00%
Silver Silver 7440-22-4 74.00%
Ethyl alcohol 64-17-5 0.60%
Bisphenol A-epichlorohydrin polymer 25068-38-6 0.60%
Xylenes (o-, m-, p-isomers) 1330-20-7 0.60%
Ethylbenzene 100-41-4 0.06%
Silicone resin - 8.62%
Silica - 8.52%
Petroleumsolvents - 7.00%
7 Lid Kovar
Epoxy Conductive Resin

2512081627_CHANGXING-ELECTRONICS-7ESC300C0033L_C48927863.pdf

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