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quality 16MHz CMOS Output Crystal Oscillator CHANGXING ELECTRONICS 3ESC160C0033L Ultra Small Seam Sealed Unit factory
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quality 16MHz CMOS Output Crystal Oscillator CHANGXING ELECTRONICS 3ESC160C0033L Ultra Small Seam Sealed Unit factory
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Specifications
Normal temperature Frequency Tolerance:
±10ppm
Voltage - Supply:
1.8V~3.3V
Operating Temperature:
-40℃~+85℃
Frequency:
16MHz
Mfr. Part #:
3ESC160C0033L
Package:
SMD2016-4P
Key Attributes
Model Number: 3ESC160C0033L
Product Description

Product Overview

The CHANGXING ELECTRONICS CO.,LTD. 2.0x1.6mm SMD Crystal Oscillator, model 3ESC160C0033L, is an ultra-small, seam-sealed clock crystal oscillator unit designed for IT products such as WLAN, Bluetooth, DSC, and DSL. It features a CMOS output and a Tri-state function, and is RoHS Compliant / Pb Free.

Product Attributes

  • Brand: CHANGXING ELECTRONICS CO.,LTD.
  • Product Series: 3E Series
  • Output Type: CMOS Output
  • Certifications: RoHS Compliant / Pb Free
  • Packaging: EIA-481-2
  • Origin: Fujian, China

Technical Specifications

Specification Value Unit
Nominal Frequency 16.000000 MHz
Tolerance @ 25 Degree 10 ppm
Stability over Operation Temp. 20 ppm
Operating Temperature Range -4085
Storage Temperature Range -55125
Input Voltage (VDD) 1.83.3 Vdc
Input Current (IDD) 5 mA max
Standby current 10 A max
Output Load 15 pF max
Rise/Fall Time 5010% ns max
Start-up Time 10 min ms
Jitter (rms) 5 ps max
Output Voltage VOL 10%VDD
Output Voltage VOH 90%VDD
Output Symmetry 10%
Aging 3 ppm/year
Dimensions 2.0 x 1.6 x 0.75 mm
MSL Level 1
Fundamental Oscillation mode 3

Marking Scheme

LOGO | Nominal Frequency (MHz) | Line Code | Last Three Digits of Production Batch Code | Year/Month Code

Example: CX16.0 .****

Year/Month Code (Four-year cycle):

Year Jan Feb Mar Apr May Jun Jul Aug Sep Oct Nov Dec
2023, 2027 a b c d e f g h j k l m
2024, 2028 n p q r s t u v w x y z
2025, 2029 A B C D E F G H J K L M
2026, 2030 N P Q R S T U V W X Y Z

Reflow Condition

Soldering profile:

  • Peak: 250+50
  • Soldering zone: 230, 3010s
  • Pre-heating zone 1: 150180, 9030s

Soldering iron method:

  • Bit temperature: 35010
  • Application time of soldering iron: 31 s

For other procedures, refer to IEC 60068-2-20.

Reliability Specifications

Standard test condition (TEMP.: 2015. Relative humidity: 6520%). For any discrepancy in GO/NG, test will be done at TEMP. 252. R.H. 655%.

ITEM TEST METHOD SPECIFICATION
High Temperature Storage GB/T 2423.2-2001, Method Ba Spending 72 hrs at 125C3C constant temperature. Measurement taken after DUT being left at room temperature for 242 hours. Frequency change after test5ppm.
Low Temperature Storage GB/T 2423.1-2001, Method Aa Spending 72 hrs at -55C3C constant temperature. Measurement taken after DUT being left at room temperature for 242 hours. Frequency change after test5ppm.
Humidity GB/T 2423.3-2006, Method Cab Spending 96 hrs at 40C 3C, with 903% R.H. Measurement taken after DUT being left at room temperature for 242 hours. Frequency change after test5ppm.
Temperature Cycle GB/T2423.22-2002, Method Nb 10 cycles from -25C to 85C. Measurement taken after DUT being left at room temperature for 242 hours. Frequency change after test5ppm.
Resistance to Soldering Heat GB/T 2423.28-2005, Test Tb Method 1B Passed through the re-flow oven under the following condition. Preheat to 150 C5C for 60 to 120sec, and peak 265 C5C for 10s3sec. Measurement taken after DUT being left at room temperature for 242 hours. Frequency change after test5ppm. No visible damages. Terminals shall be covered more than 95% with solder.
Solderability GB/T 2423.28-2005, Method Tc In 255 5 solder bath for 2 0.5 seconds. No visible damage.
Shock GB/T 2423.5-1995, Method Ea Peak 1000m/s, normal width 6ms half sine wave form, 3.7m/s, 3 perpendicular axis of samples, 3 cycles /direction, total 18 cycles. Measurement taken after 1hour. Frequency change after test5ppm.
Drop GB/T 2423.8-1995, Method Ed Free drop to the wooden plate from 1.0 m heights for 3 times. Frequency change after test5ppm. No visible damages.
Vibration GB/T 2423.10-1995, Method Fc Apply 0.75mm vibration at sweep frequency 10500 Hz, for 2h. 10 cycles in each direction of 3 axis. Measurement taken after 1 hour. Frequency change after test5ppm.
Terminal Strength JIS-C- 6429 Method 1 & 2 Mount on a glass-epoxy board (100x50x1.6mm), then bend to 2mm displacement (velocity 1mm/sec) and keep for 5 seconds. or pulling force 0.5 kg for at least 60 seconds. Frequency change after test5ppm. No visible damages.

Material Composition Declaration

No. Name of Part Material Name Constituent name CAS No. Material Analysis (%)
1 Base Ceramics Al2O3 1344-28-1 63.88%
SiO2 14464-46-1 3.79%
Cr2o3 1308-38-9 1.29%
Mo 7439-98-7 1.00%
Fe 7440-33-7 9.25%
Ni 7439-89-6 8.85%
Co 7440-02-0 4.75%
2 Lid Kovar Ag 7440-48-4 2.98%
Cu 7440-22-4 2.80%
Ni 7440-02-0 0.66%
Fe 7439-89-6 54.00%
Co 7440-48-4 17.02%
Ni 7440-02-0 28.32%
3 Adhesive Resin Epoxy - - 100.00%
4 Blank Quartz SiO2 14808-60-7 100.00%
5 Wire Gold Au 7440-57-5 100.00%
6 IC Silicon Silicon 7440-21-3 100.00%
7 Electrode Electrode Ag 7440-22-4 100.00%
Solder Solder Ag 7440-22-4 74.00%
Ethyl alcohol 64-17-5 0.60%
Bisphenol A-epichlorohydrin polymer 25068-38-6 0.60%
Xylenes (o-, m-, p-isomers) 1330-20-7 0.60%
Ethylbenzene 100-41-4 0.06%
Silicone resin - 8.62%
Silica - 8.52%
Petroleum solvents - 7.00%
Conductive Resin Epoxy - - 100.00%

2508051459_CHANGXING-ELECTRONICS-3ESC160C0033L_C48927824.pdf

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