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quality Ultra Small Seam Sealed Crystal Oscillator CHANGXING ELECTRONICS 8ESC320C0033L Compact SMD CMOS Output factory
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quality Ultra Small Seam Sealed Crystal Oscillator CHANGXING ELECTRONICS 8ESC320C0033L Compact SMD CMOS Output factory
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Specifications
Normal temperature Frequency Tolerance:
±10ppm
Voltage - Supply:
1.8V~3.3V
Operating Temperature:
-40℃~+85℃
Frequency:
32MHz
Mfr. Part #:
8ESC320C0033L
Package:
SMD3225-4P
Key Attributes
Model Number: 8ESC320C0033L
Product Description

Product Overview

The CHANGXING ELECTRONICS CO.,LTD. 8ESC320C0033L is a compact SMD crystal oscillator designed for IT products. It features ultra-small seam-sealed units suitable for applications in WLAN, Bluetooth, DSC, and DSL. This CMOS output oscillator offers a tri-state function and is RoHS Compliant / Pb Free.

Product Attributes

  • Brand: CHANGXING ELECTRONICS CO.,LTD.
  • Product Line: 8E Series
  • Origin: Fujian Province, China
  • Certifications: RoHS Compliant / Pb Free
  • Output Type: CMOS

Technical Specifications

Specification Value Unit Notes
Nominal Frequency 32.000000 MHz
Tolerance @ 25 Degree 10 ppm
Stability over Operation Temp. 20 ppm -4085
Supply Voltage (Vdd) 1.83.3 Vdc
Supply Current (Icc) 5 mA max
Standby current 8 A max
Rise/Fall Time 5 ns max
Output Load 15 pF max
Start-up Time 5 ms max
Aging 3 ppm/year
Operating Temperature Range -4085
Storage Temperature Range -55125
Phase Jitter(12KHz20MHz) 5010% ps max
Output Symmetry 10%VDD
Tri-state Function Available Enable/disable
Dimensions 3.22.51.0mm SMD
Product Number 8ESC320C0033L
Model OSC 3225
Production Weight 29.568 mg

Reflow Condition

Parameter Value Unit Notes
Peak Temperature 250+5
Soldering Zone Temperature 230 3010s
Pre-heating Zone Temperature 150180 9030s

Reliability Specifications

Item Test Method Specification
Drop GB/T 2423.8-1995, Method Ed Frequency change after test5ppm. No visible damages.
Vibration GB/T 2423.10-1995, Method Fc Frequency change after test5ppm. No visible damages.
Resistance to Soldering Heat GB/T 2423.28-2005, Test Tb Method 1B Frequency change after test5ppm. No visible damages. Terminals shall be covered more than 95% with solder.
Temperature Cycle GB/T2423.22-2002, Method Nb Frequency change after test5ppm.
Low Temperature Storage GB/T 2423.1-2001, Method Aa Frequency change after test5ppm.
Humidity GB/T 2423.3-2006, Method Cab Frequency change after test5ppm.
Shock GB/T 2423.5-1995, Method Ea Frequency change after test5ppm. No visible damages.
High Temperature Storage GB/T 2423.2-2001, Method Ba Frequency change after test5ppm.
Solderability GB/T 2423.28-2005, Method Tc Terminals shall be covered more than 95% with solder.
Terminal Strength JIS-C-6429 Method 1 & 2 No visible damages.

Material Composition Declaration

No. Name of Part Material Name Constituent name CAS No. Material Analysis(%)
1 Base Ceramics Al2O3 1344-28-1 63.88%
SiO2 14464-46-1 3.79%
Cr2o3 1308-38-9 1.29%
Mo 7439-98-7 1.00%
Fe 7440-33-7 9.25%
Ni 7439-89-6 8.85%
Co 7440-02-0 4.75%
Ag 7440-48-4 2.98%
Cu 7440-22-4 2.80%
Metallization W 7440-50-8 1.04%
Au 7440-02-0 0.24%
Ni 7440-57-5 0.13%
Fe 7439-89-6 54.00%
Co 7440-48-4 17.02%
Ni 7440-02-0 28.32%
Plate Ni 7440-02-0 0.66%
2 Lid Kovar
Epoxy Adhesive Resin - 100.00%
Conductive Resin Silicone resin - 8.62%
Silica - 8.52%
Petroleumsolvents - 7.00%
3 Blank Quartz Silicon oxide 14808-60-7 100.00%
4 Wire Gold Gold 7440-57-5 100.00%
5 IC Silicon Silicon 7440-21-3 100.00%
6 Electrode Electrode Ag 7440-22-4 100.00%
Silver 7440-22-4 74.00%
Ethyl alcohol 64-17-5 0.60%
Bisphenol A-epichlorohydrin polymer 25068-38-6 0.60%
Xylenes (o-, m-, p-isomers) 1330-20-7 0.60%
Ethylbenzene 100-41-4 0.06%

2512081627_CHANGXING-ELECTRONICS-8ESC320C0033L_C48927815.pdf

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