Product Overview
The 7ESC100CM033L is a high-precision, seam-sealed SMD Crystal Oscillator from CHANGXING ELECTRONICS CO.,LTD. Designed for automatic mounting and reflow soldering, this CMOS output oscillator offers a wide frequency range with high stability, low jitter, and low power consumption. It features a Tri-State function and operates within a supply voltage range of 1.8V to 5.0V. Ideal for applications in wireless communication, PCs, and LCDM, this RoHS Compliant / Pb Free product ensures reliable performance.
Product Attributes
- Brand: CHANGXING ELECTRONICS CO.,LTD.
- Product Type: Quartz Crystal Oscillator
- Series: 7E Series
- Output Type: CMOS Output
- Mounting Type: SMD
- Sealing: Seam sealed
- Certifications: RoHS Compliant / Pb Free
- MSL Level: 1 (IPC/JEDEC J-STD-033C)
Technical Specifications
| Specification | Value |
|---|---|
| Product Number | 7ESC100CM033L |
| Nominal Frequency | 100.000000 MHz |
| Tolerance @ 25 Degree | 10 ppm |
| Stability over Operation Temp. | 20 ppm |
| Operating Temperature Range | -40 to 85 |
| Storage Temperature Range | -55 to 125 |
| Supply Voltage (Vdd) | 1.8V to 3.3V |
| Supply Current (Icc) | 5010% A max |
| Standby current | 10 A max |
| Phase Jitter (12KHz 20MHz) | 5 ps max |
| Rise/Fall Time | 5 ns max |
| Output Voltage VOL | 30%Vdd max |
| Output Voltage VOH | 70%Vdd min |
| Output Load | 15 pF |
| Start-up Time | 10 ms max |
| Output State Control | Enable/disable |
| Aging | 3 ppm/year |
| Dimensions | 7.05.01.3mm |
| Reflow Condition Peak | 250+50 |
| Reflow Condition Soldering Zone | 230 or more, 3010s |
| Reflow Condition Pre-heating Zone 1 | 150180, 9030s |
| Soldering Iron Method Bit Temperature | 35010 |
| Soldering Iron Method Application Time | 31 s |
| Reliability Test Frequency Change | 5ppm |
| Reliability Test Drop Height | 1.0 m |
| Reliability Test Vibration Frequency | 10500 Hz |
| Reliability Test Shock Peak | 1000 m/s |
| Reliability Test Solderability Temperature | 255 5 |
| Reliability Test Solderability Time | 2 0.5 seconds |
| Reliability Test Temperature Cycle Range | -25C to 85C |
| Reliability Test Low Temperature Storage | -55C3C |
| Reliability Test Humidity Conditions | 40 C 3 C, 90 3% R.H. |
| Material Composition Declaration - Base Material | Ceramics |
| Material Composition Declaration - Lid Material | Kovar |
| Material Composition Declaration - Pin Material | Solder |
| Material Composition Declaration - Plate Material | Epoxy Conductive Resin |
| Material Composition Declaration - Chip Material | Quartz (SiO2) |
| Material Composition Declaration - Wire Material | Gold (Au) |
| Material Composition Declaration - IC Material | Silicon |
| Material Composition Declaration - Electrode Material | Silver (Ag) |
2512081627_CHANGXING-ELECTRONICS-7ESC100CM033L_C48927868.pdf
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