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quality Multilayer chip ceramic capacitor CCTC TCC1206M3L104J500FT designed for minimal capacitance change and high stability factory
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quality Multilayer chip ceramic capacitor CCTC TCC1206M3L104J500FT designed for minimal capacitance change and high stability factory
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Specifications
Voltage Rating:
50V
Capacitance:
100nF
Temperature Coefficient:
-
Tolerance:
±5%
Mfr. Part #:
TCC1206M3L104J500FT
Package:
1206
Key Attributes
Model Number: TCC1206M3L104J500FT
Product Description

Product Overview

The TCC1206M3L series are low-distortion multilayer chip ceramic capacitors designed for applications requiring stable electrical properties with minimal change in capacitance due to voltage and time. These Class I capacitors offer a temperature coefficient of -0.1%/C, making them suitable for circuits demanding low loss and high stability.

Product Attributes

  • Brand: CCTC ()
  • Origin: China
  • Product Name: Multilayer Chip Ceramic Capacitor
  • Part Numbers: TCC1206M3L473J500FT, TCC1206M3L104J500FT
  • Approval Sheet No.: DRAAW108A/0-2018
  • Issued Date: 2018-06-02

Technical Specifications

SpecificationTypeRequirementTest Condition
AppearanceM3LNo defects or abnormalitiesVisual inspection
Dimensions1206Within the specified dimensionsUsing calipers on micrometer
CapacitanceM3LWithin the specified tolerance (J: 5%)1.00.2Vrms, 1KHz10% 2030, environment humidity 70% pre-treatment 48hrs.
Dissipation FactorM3LDF 0.5%1.00.2Vrms, 1KHz10% (Cp>10uF, 0.50.2Vrms, 120Hz) 2030, environment humidity 70% pre-treatment 48hrs.
Insulation ResistanceM3LMore than 1 GTest for 605sec, at 2030, humility under 70%, under test voltage: UR 50V UT 50V
Dielectric StrengthM3LNo defects or abnormalitiesApplied voltage 5 seconds, charge/discharge current not exceeding 50 mA. Rated voltage 50V, Test voltage 125V.
Temperature Coefficient of CapacitanceM3LTemperature coefficient within -0.05%/ ~ -0.20%/Measure capacitance under sequential temperatures (-55, 25, 85). Calculation based on reference capacitance at 25.
AdhesionM3LNo removal of the terminations or other defect shall occur.Applying a force of 6N (=600g*f) for 101 seconds.
Solderability of TerminationM3L95% min. coverage of both terminal electrodes and less than 5% have pin holes or rough spots.Solder temperature: 2455, Dipping time: 21 seconds. Both terminal electrodes completely immersed.
Resistance to leachingM3L95% min. coverage of both terminal electrodes and less than 5% have pin holes or rough spots. No remarkable visual damage.Preheating: 120~150/60 sec. Solder temperature: 2705, Dipping time: 101 seconds. Both terminal electrodes completely immersed.
Bending (End Electrode Bond Strength)M3LNo remarkable visual damage; Cp change 5% or 0.5 pFCapacitor mounted on test fixture, pressurized at 1.0mm/s to a deflection of 1.0mm.
Resistance to Soldering HeatM3LNo remarkable visual damage. Cp change within 2.5% or 0.25pF (larger value). DF meets initial standard value. IR meets initial standard value.Soldering temperature: 2705. Preheating: 120~150/60sec. Dipping time: 101 seconds. Measurement after 242 hours at room temperature.
Temperature CycleM3LNo remarkable visual damage. Cp change within 2.5% or 0.25pF (larger value). DF meets initial standard value. IR meets initial standard value.5 cycles: -55 (30min), 25 (2~3min), 85 (30min), 25 (2~3min). Measurement after 242 hours at room temperature.
Moisture Resistance, steady stateM3LNo remarkable visual damage. Cp change within 5% or 0.5pF (larger value). Cp30pF, Q350. R*C1000M or 50F (smaller value).Test temperature: 402. Humidity: 90~95% RH. Testing time: 500 12hrs. Measurement after 242 hours at room temperature.
Life TestM3LNo remarkable visual damage. Cp change 5% or 0.5pF (larger value). DF: Not more than 2 times of initial value. R*C1000M or 50F (smaller value).Test temperature: Max. 85. Voltage: 150% of rated voltage (UR < 100V). Testing time: 1000 hrs. Measurement after 242 hours at room temperature.

2410121310_CCTC-TCC1206M3L104J500FT_C359189.pdf

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