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quality Multilayer Chip Ceramic Capacitor CCTC TCC1210X7R225K101MT Designed for Stable Temperature and Electronic Circuit factory
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quality Multilayer Chip Ceramic Capacitor CCTC TCC1210X7R225K101MT Designed for Stable Temperature and Electronic Circuit factory
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Specifications
Voltage Rating:
100V
Capacitance:
2.2uF
Temperature Coefficient:
X7R
Tolerance:
±10%
Mfr. Part #:
TCC1210X7R225K101MT
Package:
1210
Key Attributes
Model Number: TCC1210X7R225K101MT
Product Description

Multilayer Chip Ceramic Capacitor

This document specifies the requirements for Multilayer Chip Ceramic Capacitors (MLCCs), specifically the TCC1210X7R225K101MT model. These capacitors are designed for general-purpose applications requiring stable temperature characteristics and a wide operating temperature range. They are suitable for circuits such as DC-blocking, decoupling, bypassing, and frequency discriminating.

Product Attributes

  • Product Name: Multilayer Chip Ceramic Capacitor
  • Part Number: TCC1210X7R225K101MT
  • Approval Sheet No.: DRAAW108M/1-2023
  • Issued Date: 2024/1/23
  • Dielectric Material: X7R (Class II capacitor with semi-stable temperature characteristics)

Technical Specifications

Specification Dielectric Technical Requirement Testing Condition
Appearance X7R Visual inspection -
Dimensions X7R Within the specified dimensions Using calipers on micrometer (l1/8L, w1/8W, t1/8T)
Capacitance X7R Within the specified tolerance 1.00.2Vrms, 1KHz10% (253, <70%RH, after 150 heat treatment for 1 hour and 48 hours rest)
Dissipation Factor X7R DF10% 1.00.2Vrms, 1KHz10% (253, <70%RH, after 150 heat treatment for 1 hour and 48 hours rest)
Insulation Resistance X7R 45.45M Test voltage: 100V; Charge time: 605 sec; Temperature: 25
Dielectric Strength X7R UR=100V Apply 200VDC for 5 seconds. Max. current should not exceed 50 mA.
Temperature Coefficient of Capacitance X7R Capacitance change within 15% Sequence test at -55, 25, 125 (253, <70%RH, after 150 heat treatment for 1 hour and 48 hours rest)
Adhesion X7R No removal of the terminations or other defect shall occur. Pressurizing force: 6N, duration: 101 sec
Solderability of Termination X7R 95% min-coverage of both terminal electrodes and less than 5% have pin holes or rough spots. Solder temperature: 2455, Dipping time: 21 seconds.
Resistance to leaching X7R 95% min. coverage of both terminal electrodes and less than 5% have pin holes or rough spots. No remarkable visual damage. Preheated: 120~150/60sec, Solder temperature: 2705, Dipping time: 101 seconds.
Bending X7R No remarkable visual damage; Cp change 10%. Install capacitor on substrate, apply pressure at 1.0mm/s to bend 1mm.
Resistance to Soldering Heat X7R No remarkable visual damage, Cp change within 7.5%. DF and IR meets initial standard value. Preheating: 120~150 60sec. Soldering temperature: 2705. Dipping time: 101 seconds. (Measurement after 484 hours at room temperature, with initial measurement for high dielectric constant type after 140~150 heat treatment for 1hr and 484hrs rest).
Temperature Cycle X7R No remarkable visual damage. Cp change within 7.5%. 5 cycles: -55 (30min), 25 (2-3min), 125 (30min), 25 (2-3min). (Measurement after 484 hours at room temperature, with initial measurement for high dielectric constant type after 140~150 heat treatment for 1hr and 484hrs rest).
Moisture Resistance, steady state X7R No obvious visual damage, Cp change within 12.5%. DF: Not more than 2 times of initial value. IR4.55M. Test temperature: 402, Humidity: 90~95% RH, Testing time: 500 12hrs. (Measurement after 484 hours at room temperature, with initial measurement for high dielectric constant type after 140~150 heat treatment for 1hr and 484hrs rest).
Damp heat with load X7R No remarkable visual damage, Cp change12.5%. DF: Not more than 2 times of initial value. IR2.27M. Test temperature: 402, Humidity: 90~95% RH, Voltage: 100% of rated voltage, Charge/discharge current: 50mA, Testing time: 500 12hrs. (Measurement after soldering and 484 hours at room temperature, then after 150 for 1h and 48h rest).
Life Test X7R No remarkable visual damage. Cp change12.5%. DF: Not more than 2 times of initial value. IR2.27M. Test temperature: Max. Operating Temp. 3, Voltage: 100% of rated voltage, Charge/discharge current: 50mA, Testing time: 1000 hrs. (Measurement after soldering and 484 hours at room temperature, then after 150 for 1h and 48h rest).

2410121439_CCTC-TCC1210X7R225K101MT_C5449052.pdf

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